公开(公告)号：DE10116818A1

公开(公告)日：2001-10-11

申请号：DE10116818

申请日：2001-04-04

Applicant: BASF AG

Inventor： SCHROF WOLFGANG ,  WARMING JENS ,  HINTZE-BRUENING HORST ,  ETZRODT GUENTER

IPC: C09D5/46 ,  G02B21/00 ,  G01N21/39 ,  B32B15/08 ,  C09D5/38

Abstract: Determining the condition of metal plates in metallic base lacquers comprises using a three-dimensional laser scanning microscope. An Independent claim is also included for a device for carrying out the process comprising an arrangement for receiving at least one sample of a metallic base lacquer; a laser scanning microscope; and a image evaluation device. Preferred Features: The process comprises receiving at least two confocal laser scanning pictures in different depths of the base lacquer vertical to the substrate; and evaluating the pictures using automatic picture evaluation to determine the depth distribution of one condition.