公开(公告)号：SE433671B

公开(公告)日：1984-06-04

申请号：SE7812490

申请日：1978-12-05

Applicant: BURROUGHS CORP

Inventor： YUEN R C ,  MENEZES M A ,  STOPPER H

IPC: G01R31/28 ,  G01R31/30 ,  G01R31/3185 ,  G06F11/00 ,  H01L21/66 ,  H01L21/822 ,  H01L27/04

Abstract: An In-Situ Test and Diagnostic Circuit and Method to monitor the integrity of external connections of a current mode logic integrated circuit chip (inputs and outputs) as well as the integrity of the logic function thereof. The circuit comprises three parts: an "Open" Input Detector to detect open connections or connections that are becoming open between one chip and another; an Output Short Detector to monitor shorts at any chip output; and a Signature Test and Diagnostic circuit to determine if the logic function of the chip itself is operational. All the foregoing circuit parts are formed as an integral part of each CML chip and connected to an output terminal called a Test and Diagnostic Pin.

公开(公告)号：YU287178A

公开(公告)日：1982-10-31

申请号：YU287178

申请日：1978-12-07

Applicant: BURROUGHS CORP

Inventor： YUEN R C ,  MENEZES M A ,  STOPPER H

IPC: G01R31/28 ,  G01R31/30 ,  G01R31/3185 ,  G06F11/00 ,  H01L21/66 ,  H01L21/822 ,  H01L27/04 ,  H01L49/00 ,  H03K19/00

Abstract: An In-Situ Test and Diagnostic Circuit and Method to monitor the integrity of external connections of a current mode logic integrated circuit chip (inputs and outputs) as well as the integrity of the logic function thereof. The circuit comprises three parts: an "Open" Input Detector to detect open connections or connections that are becoming open between one chip and another; an Output Short Detector to monitor shorts at any chip output; and a Signature Test and Diagnostic circuit to determine if the logic function of the chip itself is operational. All the foregoing circuit parts are formed as an integral part of each CML chip and connected to an output terminal called a Test and Diagnostic Pin.

公开(公告)号：SE7812490L

公开(公告)日：1979-06-24

申请号：SE7812490

申请日：1978-12-05

Applicant: BURROUGHS CORP

Inventor： YUEN R C ,  MENEZES M A ,  STOPPER H

IPC: G01R31/28 ,  G01R31/30 ,  G01R31/3185 ,  G06F11/00 ,  H01L21/66 ,  H01L21/822 ,  H01L27/04

Abstract: An In-Situ Test and Diagnostic Circuit and Method to monitor the integrity of external connections of a current mode logic integrated circuit chip (inputs and outputs) as well as the integrity of the logic function thereof. The circuit comprises three parts: an "Open" Input Detector to detect open connections or connections that are becoming open between one chip and another; an Output Short Detector to monitor shorts at any chip output; and a Signature Test and Diagnostic circuit to determine if the logic function of the chip itself is operational. All the foregoing circuit parts are formed as an integral part of each CML chip and connected to an output terminal called a Test and Diagnostic Pin.

公开(公告)号：SE7812490A

公开(公告)日：1979-06-24

申请号：SE7812490

申请日：1978-12-05

Applicant: BURROUGHS CORP

Inventor： YUEN R C ,  MENEZES M A ,  STOPPER H

IPC: G01R31/28 ,  G01R31/30 ,  G01R31/3185 ,  G06F11/00 ,  H01L21/66 ,  H01L21/822 ,  H01L27/04

CPC classification number: G01R31/3185 ,  G01R31/3004 ,  G06F11/006 ,  G06F2201/83