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    MICROSCOPE SYSTEM AND CONTROL METHOD THEREOF
    1.
    发明申请
    MICROSCOPE SYSTEM AND CONTROL METHOD THEREOF 审中-公开
    显微镜系统及其控制方法

    公开(公告)号：WO2016092815A3

    公开(公告)日：2016-10-27

    申请号：PCT/JP2015006083

    申请日：2015-12-08

    Applicant: CANON KK

    Inventor： SAKAMOTO MICHIIE ,  HASHIGUCHI AKINORI ,  MASUDA SHINOBU ,  SAKATA TSUGUHIDE ,  HASEGAWA MASAHIDE ,  ANDO MASAHIRO ,  NAGATSUKA OSAMU ,  NISHIKAWA KOICHIRO

    IPC: G02B21/26 ,  G02B21/36

    CPC classification number: G02B21/365 ,  G02B21/26 ,  G02B21/36 ,  G02B21/362

    Abstract: A microscope system comprises a microscope body, an image sensor mounted on the microscope body via mounting means and configured to capture an observation image under a microscope, and a stage that moves in an X-axis direction and a Y-axis direction, which are orthogonal to each other, and places a slide as an observation object and includes a mark used to indicate a stage reference position. The microscope system obtains positions of the stage in the X-axis direction and the Y-axis direction, and detects, from an image captured by the image sensor, the stage reference position indicated by a mark provided on the stage and a slide reference position indicated by a mark provided on a slide placed on the stage. The microscope system manages the position of the stage by coordinates based on the slide reference position if the slide reference position is detected, and manages the position of the stage by coordinates based on the stage reference position if the slide reference position is not detected.

    Abstract translation: 显微镜系统包括显微镜主体，通过安装装置安装在显微镜主体上并被配置为在显微镜下捕获观察图像的图像传感器以及在X轴方向和Y轴方向上移动的台，所述台是 彼此正交，并且将幻灯片放置为观察对象并且包括用于指示阶段参考位置的标记。 显微镜系统通过获取载物台在X轴方向和Y轴方向上的位置，并且从由图像传感器捕获的图像中检测由载物台上提供的标记所指示的载物台基准位置和载玻片基准位置 由舞台上放置的幻灯片上的标记指示。 如果检测到滑动基准位置，则显微镜系统通过基于滑动基准位置的坐标来管理平台的位置，并且如果未检测到滑动基准位置，则通过基于平台基准位置的坐标来管理平台的位置。

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