AN X-RAY FLUORESCENCE SYSTEM
    1.
    发明申请

    公开(公告)号:US20240385129A1

    公开(公告)日:2024-11-21

    申请号:US18693902

    申请日:2022-09-20

    Abstract: The application discloses an X-ray fluorescence system comprising an X-ray source to emit X-ray radiation incident on the sample and a controller to vary an energy of the X-ray radiation incident on the sample between at least a first incident radiation energy and a second incident radiation energy. The system further comprises an X-ray fluorescence detector to detect X-ray radiation fluoresced by the sample in response to the incident X-ray radiation and determine at least: a first fluorescence radiation intensity of X-ray radiation fluoresced by the sample in response to the X-ray radiation incident on the sample at the first incident energy and a second fluorescence radiation intensity of X-ray fluorescence radiation fluoresced by the sample in response to the X-ray radiation incident on the sample at the second incident energy. A method of X-ray fluorescence is also disclosed.

    Method for rapid analysis of gold
    2.
    发明授权
    Method for rapid analysis of gold 有权
    黄金快速分析方法

    公开(公告)号:US09528951B2

    公开(公告)日:2016-12-27

    申请号:US15104279

    申请日:2014-12-16

    Abstract: A method to determine a concentration of a target element in a sample is provide. The method comprises (i) positioning a sample containing a target element with respect to a reference material containing a reference element, (ii) simultaneously irradiating the sample and the reference material with Bremsstrahlung X-rays to thereby produce activated nuclei in the target element and to produce activated nuclei in the reference element, (iii) detecting deactivation gamma-rays' from the irradiated sample and deactivation gamma-rays from the irradiated reference material, (iv) determining a first number of detected deactivation gamma-rays from the irradiated sample and a second number of detected deactivation gamma-rays from the reference material, and (v) determining the concentration of the target element in the sample by first normalising the first number of detected deactivation gamma-rays from the irradiated sample by the second number of detected deactivation gamma-rays from the reference material. The variation of the reference element to target element cross section ratio over a range of electron beam energies is less than a predetermined measurement accuracy.

    Abstract translation: 提供了确定样品中目标元素浓度的方法。 该方法包括(i)相对于包含参考元件的参考材料定位包含目标元素的样品,(ii)用Bre致辐射X射线同时照射样品和参考物质,从而在目标元素中产生活化的核, 在参考元件中产生活化的核,(iii)从照射的样品中检测去激活的γ射线,以及从照射的参考物质中去激活γ射线,(iv)从被照射样品中确定检测到的去激活γ射线的第一数量 和来自所述参考物质的检测到的去激活γ射线的第二数量,以及(v)通过首先将来自被照射的样品的检测到的去激活γ射线的第一数量归一化来确定样品中目标元素的浓度第二数目 检测到来自参考物质​​的失活γ射线。 参考元件与目标元件截面比在电子束能量范围内的变化小于预定的测量精度。

    RAPID ORE ANALYSIS TO ENABLE BULK SORTING USING GAMMA-ACTIVATION ANALYSIS

    公开(公告)号:US20210208087A1

    公开(公告)日:2021-07-08

    申请号:US17124595

    申请日:2020-12-17

    Abstract: An apparatus for bulk ore sorting using gamma activation analysis is disclosed. The apparatus includes a conveyor system that includes one or more conveyor belts, surrounded by one or more radiation shields, to transport ore material along a transport path. A pulsed X-ray radiation source is configured to irradiate ore material at an irradiation region and one or more detectors are configured to detect a gamma radiation output from irradiated ore material at a detection region. The transport path has a bend, located between the irradiation region and the detection region, and about a vertical axis, of at least 45 degrees. The one or more detectors are configured to detect a radiation output from the irradiated ore material at times between X-ray pulses of the pulsed X-ray radiation source irradiating the ore material.

    Trace element X-ray flourescence analyser using dual focusing X-ray monochromators
    5.
    发明授权
    Trace element X-ray flourescence analyser using dual focusing X-ray monochromators 有权
    微量元素X射线荧光分析仪采用双重聚焦X射线单色仪

    公开(公告)号:US09291583B2

    公开(公告)日:2016-03-22

    申请号:US13957803

    申请日:2013-08-02

    CPC classification number: G01N23/223 G01N2223/076

    Abstract: An X-ray fluorescence analyzer is provided which comprises: (1) an X-ray source selected to produce an intense X-ray beam, (2) a first optical element that focuses the X-ray beam produced by the X-ray source onto a sample and selects X-rays of a desired energy, (3) an energy resolving detector, and (4) a second optical element that receives fluorescent X-rays emitted from elements in the sample and focuses a selected energy range of said fluorescent X-rays onto said energy resolving detector. Each of the first and second optical elements includes a crystal component. The X-ray fluorescence analyzer is configured such that: (i) the X-ray source has a spot size dimensioned so that it is substantially in a field of view of the first optical element, and (ii) the first optical element focuses the X-ray beam emitted by the X-ray source onto an area of the sample that corresponds to a field-of-view of the second optical element. Furthermore, the field of view for an optical element is defined as the area in the source plane of the respective crystal component over which X-rays are able to be emitted and still efficiently be reflected by said optical element.

    Abstract translation: 提供了一种X射线荧光分析仪,其包括:(1)选择产生强烈X射线束的X射线源,(2)将由X射线源产生的X射线束聚焦的第一光学元件 并选择所需能量的X射线,(3)能量分辨检测器,和(4)第二光学元件,其接收从样品中的元素发射的荧光X射线,并聚焦所述荧光物质的选定能量范围 X射线到所述能量分辨检测器上。 第一和第二光学元件中的每一个包括晶体分量。 所述X射线荧光分析装置的特征在于:(i)所述X射线源的光斑尺寸被设计为使得其大体上位于所述第一光学元件的视野内,以及(ii)所述第一光学元件将所述 由X射线源发射的X射线束对应于与第二光学元件的视野相对应的样品区域。 此外,光学元件的视野被定义为能够发射X射线并且仍然有效地被所述光学元件反射的各个晶体分量的源平面中的面积。

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