Abstract:
The application discloses an X-ray fluorescence system comprising an X-ray source to emit X-ray radiation incident on the sample and a controller to vary an energy of the X-ray radiation incident on the sample between at least a first incident radiation energy and a second incident radiation energy. The system further comprises an X-ray fluorescence detector to detect X-ray radiation fluoresced by the sample in response to the incident X-ray radiation and determine at least: a first fluorescence radiation intensity of X-ray radiation fluoresced by the sample in response to the X-ray radiation incident on the sample at the first incident energy and a second fluorescence radiation intensity of X-ray fluorescence radiation fluoresced by the sample in response to the X-ray radiation incident on the sample at the second incident energy. A method of X-ray fluorescence is also disclosed.
Abstract:
A method to determine a concentration of a target element in a sample is provide. The method comprises (i) positioning a sample containing a target element with respect to a reference material containing a reference element, (ii) simultaneously irradiating the sample and the reference material with Bremsstrahlung X-rays to thereby produce activated nuclei in the target element and to produce activated nuclei in the reference element, (iii) detecting deactivation gamma-rays' from the irradiated sample and deactivation gamma-rays from the irradiated reference material, (iv) determining a first number of detected deactivation gamma-rays from the irradiated sample and a second number of detected deactivation gamma-rays from the reference material, and (v) determining the concentration of the target element in the sample by first normalising the first number of detected deactivation gamma-rays from the irradiated sample by the second number of detected deactivation gamma-rays from the reference material. The variation of the reference element to target element cross section ratio over a range of electron beam energies is less than a predetermined measurement accuracy.
Abstract:
An apparatus for bulk ore sorting using gamma activation analysis is disclosed. The apparatus includes a conveyor system that includes one or more conveyor belts, surrounded by one or more radiation shields, to transport ore material along a transport path. A pulsed X-ray radiation source is configured to irradiate ore material at an irradiation region and one or more detectors are configured to detect a gamma radiation output from irradiated ore material at a detection region. The transport path has a bend, located between the irradiation region and the detection region, and about a vertical axis, of at least 45 degrees. The one or more detectors are configured to detect a radiation output from the irradiated ore material at times between X-ray pulses of the pulsed X-ray radiation source irradiating the ore material.
Abstract:
An apparatus for bulk ore sorting using gamma activation analysis is disclosed. The apparatus includes a conveyor system that includes one or more conveyor belts, surrounded by one or more radiation shields, to transport ore material along a transport path. A pulsed X-ray radiation source is configured to irradiate ore material at an irradiation region and one or more detectors are configured to detect a gamma radiation output from irradiated ore material at a detection region. The transport path has a bend, located between the irradiation region and the detection region, and about a vertical axis, of at least 45 degrees. The one or more detectors are configured to detect a radiation output from the irradiated ore material at times between X-ray pulses of the pulsed X-ray radiation source irradiating the ore material.
Abstract:
An X-ray fluorescence analyzer is provided which comprises: (1) an X-ray source selected to produce an intense X-ray beam, (2) a first optical element that focuses the X-ray beam produced by the X-ray source onto a sample and selects X-rays of a desired energy, (3) an energy resolving detector, and (4) a second optical element that receives fluorescent X-rays emitted from elements in the sample and focuses a selected energy range of said fluorescent X-rays onto said energy resolving detector. Each of the first and second optical elements includes a crystal component. The X-ray fluorescence analyzer is configured such that: (i) the X-ray source has a spot size dimensioned so that it is substantially in a field of view of the first optical element, and (ii) the first optical element focuses the X-ray beam emitted by the X-ray source onto an area of the sample that corresponds to a field-of-view of the second optical element. Furthermore, the field of view for an optical element is defined as the area in the source plane of the respective crystal component over which X-rays are able to be emitted and still efficiently be reflected by said optical element.