公开(公告)号：DE3584646D1

公开(公告)日：1991-12-19

申请号：DE3584646

申请日：1985-01-24

Applicant: COULTER ELECTRONICS

Inventor： PRONI OSCAR ,  JAMES BOBBY DENCIL

IPC: G01N15/12 ,  G01N27/00

Abstract: A particle analyzing apparatus and method of moving and counting particles in suspension through such an apparatus. The particle analyzing apparatus comprises a particle counting device wherein particles in suspension are caused to be moved through an aperture whose effective impedance is changed with the passage of each particle therethrough and a fluid connection means for drawing a quantity of the suspension through the aperture, including a source of vacuum. The source of vacuum comprises a bellows having an end, and a constant force means connected to the end of the bellows means.

公开(公告)号：AU575378B2

公开(公告)日：1988-07-28

申请号：AU3935385

申请日：1985-01-24

Applicant: COULTER ELECTRONICS

Inventor： PRONI OSCAR ,  JAMES BOBBY DENCIL

IPC: G01N15/12 ,  G01N1/14

Abstract: A particle analyzing apparatus and method of moving and counting particles in suspension through such an apparatus. The particle analyzing apparatus comprises a particle counting device wherein particles in suspension are caused to be moved through an aperture whose effective impedance is changed with the passage of each particle therethrough and a fluid connection means for drawing a quantity of the suspension through the aperture, including a source of vacuum. The source of vacuum comprises a bellows having an end, and a constant force means connected to the end of the bellows means.

公开(公告)号：BR8505007A

公开(公告)日：1986-01-21

申请号：BR8505007

申请日：1985-01-24

Applicant: COULTER ELECTRONICS

Inventor： PRONI OSCAR ,  JAMES BOBBY DENCIL

IPC: G01N15/12 ,  G01N27/00

Abstract: A particle analyzing apparatus and method of moving and counting particles in suspension through such an apparatus. The particle analyzing apparatus comprises a particle counting device wherein particles in suspension are caused to be moved through an aperture whose effective impedance is changed with the passage of each particle therethrough and a fluid connection means for drawing a quantity of the suspension through the aperture, including a source of vacuum. The source of vacuum comprises a bellows having an end, and a constant force means connected to the end of the bellows means.

公开(公告)号：AU3935385A

公开(公告)日：1985-08-27

申请号：AU3935385

申请日：1985-01-24

Applicant: COULTER ELECTRONICS

Inventor： PRONI OSCAR ,  JAMES BOBBY DENCIL

IPC: G01N15/12 ,  G01N27/00

Abstract: A particle analyzing apparatus and method of moving and counting particles in suspension through such an apparatus. The particle analyzing apparatus comprises a particle counting device wherein particles in suspension are caused to be moved through an aperture whose effective impedance is changed with the passage of each particle therethrough and a fluid connection means for drawing a quantity of the suspension through the aperture, including a source of vacuum. The source of vacuum comprises a bellows having an end, and a constant force means connected to the end of the bellows means.

公开(公告)号：IT1182144B

公开(公告)日：1987-09-30

申请号：IT4758685

申请日：1985-01-24

Applicant: COULTER ELECTRONICS

Inventor： PRONI OSCAR ,  JAMES BOBBY DENCIL

IPC: G01N15/12 ,  G01N

Abstract: A particle analyzing apparatus and method of moving and counting particles in suspension through such an apparatus. The particle analyzing apparatus comprises a particle counting device wherein particles in suspension are caused to be moved through an aperture whose effective impedance is changed with the passage of each particle therethrough and a fluid connection means for drawing a quantity of the suspension through the aperture, including a source of vacuum. The source of vacuum comprises a bellows having an end, and a constant force means connected to the end of the bellows means.

公开(公告)号：IT8547586D0

公开(公告)日：1985-01-24

申请号：IT4758685

申请日：1985-01-24

Applicant: COULTER ELECTRONICS

Inventor： PRONI OSCAR ,  JAMES BOBBY DENCIL

IPC: G01N15/12 ,  G01N

Abstract: A particle analyzing apparatus and method of moving and counting particles in suspension through such an apparatus. The particle analyzing apparatus comprises a particle counting device wherein particles in suspension are caused to be moved through an aperture whose effective impedance is changed with the passage of each particle therethrough and a fluid connection means for drawing a quantity of the suspension through the aperture, including a source of vacuum. The source of vacuum comprises a bellows having an end, and a constant force means connected to the end of the bellows means.

公开(公告)号：EP0169897A4

公开(公告)日：1987-10-08

申请号：EP85901152

申请日：1985-01-24

Applicant: COULTER ELECTRONICS

Inventor： PRONI OSCAR ,  JAMES BOBBY DENCIL

IPC: G01N15/12 ,  G01N27/00

CPC classification number: G01N15/1209