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公开(公告)号：US12231618B2
公开(公告)日：2025-02-18
申请号：US18163473
申请日：2023-02-02
Applicant: Communications Test Design, Inc.
Inventor： Aaron Santangelo , Christian Cote , Srinidhi Ramesh , Nannam Simla
Abstract: A test system includes a computer system including a processor and a memory; and an electronic interface in communications with the computer and a television device under test, the electronic interface including a test interface board configured to permit the television device under test to be put into a debug mode by the computer system.
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公开(公告)号：US20250106380A1
公开(公告)日：2025-03-27
申请号：US18975440
申请日：2024-12-10
Applicant: Communications Test Design, Inc.
Inventor： Aaron SANTANGELO , Christian COTE , Srinidhi Ramesh , Nannam Simla
Abstract: A test system includes a computer system including a processor and a memory; and an electronic interface in communications with the computer and a television device under test, the electronic interface including a test interface board configured to permit the television device under test to be put into a debug mode by the computer system.
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公开(公告)号：US20240267508A1
公开(公告)日：2024-08-08
申请号：US18163473
申请日：2023-02-02
Applicant: Communications Test Design, Inc.
Inventor： Aaron Santangelo , Christian Cote , Srinidhi Ramesh , Nannam Simla
CPC classification number: H04N17/004 , G06T7/0004 , G06T7/13 , G06T7/20 , G06T7/70 , G06T7/90 , H04N9/67 , H04N17/02 , G06T2207/30241 , H04N2017/006
Abstract: A test system includes a computer system including a processor and a memory; and an electronic interface in communications with the computer and a television device under test, the electronic interface including a test interface board configured to permit the television device under test to be put into a debug mode by the computer system.
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