Abstract:
A technique for reducing a parasitic DC bias voltage on a sensor (S1) monitors the parasitic DC bias voltage on a first element (10) of the sensor (S1). A controlled bias voltage that is applied between the first element (10) of the sensor (S1) and a second element (12) of the sensor (S1) is then modified to substantially maintain the parasitic DC bias voltage at a desired potential.
Abstract:
A technique for discharging an energy storage device coupled to a power bus provides a first discharge path for the energy storage device (C BUS ), when the power bus is connected to a battery (V BATT ), and a second discharge path for the energy storage device (C BUS ), when the power bus is disconnected from the battery (V BATT ). The first discharge path has a higher impedance value than the second discharge path.
Abstract:
A technique for reducing a parasitic DC bias voltage on a sensor (S1) monitors the parasitic DC bias voltage on a first element (10) of the sensor (S1). A controlled bias voltage that is applied between the first element (10) of the sensor (S1) and a second element (12) of the sensor (S1) is then modified to substantially maintain the parasitic DC bias voltage at a desired potential.
Abstract:
A method for measuring an impedance of a sensor (S1) that is subject to ion migration includes a number of steps. Initially, a first electrical pulse (VCELL) is applied to an input of the sensor (S1), whose impedance varies according to a first gas concentration in a gas stream. Next, a second electrical pulse (VCELL) is applied to the input of the sensor (S1). The energy of the first and second electrical pulses (VCELL) is approximately the same and the first and second electrical pulses (VCELL) have opposite polarity. A sensor load current (ICELL) is determined during at least one of the first and second electrical pulses (VCELL) to provide a first sensor current (ICELL). Then, the sensor load current (ICELL) during the same one of the first and second electrical pulses (VCELL) is determined to provide a second sensor current (ICELL). Finally, at least one component of the impedance of the sensor (S1) is determined based upon the first and second sensor currents (ICELL).