Method and apparatus to detect device functionality
    2.
    发明公开
    Method and apparatus to detect device functionality 审中-公开
    Verfahren und Vorrichtung zum Erkennen derGerätefunktionalität

    公开(公告)号:EP2781927A1

    公开(公告)日:2014-09-24

    申请号:EP13159945.8

    申请日:2013-03-19

    Abstract: A method of testing the operational functionality of a component (15), said component being supplied by a supply voltage V via switching means (16), comprising connecting the output of the switching means to further circuitry comprising a first resistor (R1) connected to a first reference voltage (Vcc), and a second resistor (R2) connected to a second reference voltage, and determining the voltage at a point (A) between said resistors when the switching means is in either a nominally "on" and/or an "off" state.

    Abstract translation: 一种测试组件(15)的操作功能的方法,所述组件由经由开关装置(16)的电源电压V提供,包括将开关装置的输出连接到另外的电路,该电路包括连接到 第一参考电压(Vcc)和连接到第二参考电压的第二电阻器(R2),并且当开关装置在标称“开”时确定所述电阻器之间的点(A)处的电压,和/或 一个“关”状态。

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