Abstract:
A bipolar resistive switching device comprises a bottom electrode, a stack of at least two transition metal oxides layers, the stack including at least one oxygen gettering layer, and a top electrode. A particular configuration is Pt/TaOx/CrOy/Cr/Cu. Methods for manufacturing and use of the bipolar resistive switching device are disclosed as well.
Abstract:
A multi-camera hemispherical very wide field of view imaging apparatus with omnidirectional illumination capability comprises a cylindrical body (4, 4.a, 4.b), a hemispherical mechanical frame (2) arranged on one end of the cylindrical body (4, 4.a, 4.b), a plurality of imaging channels (3), each imaging channel (3) comprising at least an image sensor and related optics with a fixed focus appropriate for endoscopic imaging, the plurality of imaging channels (3) being distributed over the hemispherical mechanical frame (2), a light source arranged centre-down at a back part of the plurality of imaging channels (3) and inside or at the end of the cylindrical body (4, 4.a, 4.b). Each imaging channel (3) comprises a plurality of lightning channels (1) around their centre, each of the plurality of lightning channels (1) comprising at least one microfiber light guide having a determined angle of curvature arranged to transmit the light from the light source. The imaging apparatus further comprises a control and processing circuit (5) comprising a camera control unit (6), an illumination control unit (7), an illumination unit (8), a sample and capture unit (9), an image processing unit (10) and an output interface (11) to a PC. The camera control unit (6) is configured to power each of the plurality of imaging channels (3) and make automatic gain compensation for each imaging channel (3), the illumination control unit (7) is configured for automatic intensity dimming, the sample and capture unit (9) is an interface circuit for correct sampling, extraction and capturing frames of individual imaging channels (3), the image processing unit (10) is configured for constructing a spherical panoramic image by applying a determined algorithm, and the output interface (11) is arranged to output the spherical panoramic image to a system configured to visualize it.
Abstract:
A method for performing a post processing patterning on a diced chip having a footprint, comprises the steps of: - providing a support wafer; - applying a first dry film photoresist to the support wafer; - positioning a mask corresponding to the footprint of the diced chip on the first dry film photoresist; - exposing the mask and the first dry film photoresist to UV radiation; - removing the mask; - developing the exposed first dry film photoresist to obtain a cavity corresponding to the diced chip; - positioning the diced chip inside the cavity; - applying a second dry film photoresist to the first film photoresist and the diced chip; - exposing and developing the second dry film photoresist applied to the diced chip in accordance with the post processing pattern; and - performing an anisotropic dry etching of the chip to form a via therein. Furthermore, a method for obtaining a stack of two semiconductor chips or wafers in a back to face configuration, whereby at least one of the semiconductor chips or wafers comprises a through silicon via (TSV), comprises the steps of: - providing a first semiconductor chip or wafer; - providing a second semiconductor chip or wafer; - making a hole through the second semiconductor chip or wafer from a face side to a back side; - applying the face side of second semiconductor chip or wafer on a release tape; - depositing parylene on the assembly of the second semiconductor chip or wafer and the release tape, thereby obtaining a sidewall passivation in the hole and a bonding layer on the back side of the second semiconductor chip or wafer; - releasing the release tape, thereby obtaining a membrane of parylene covering an opening of the hole on the front side; - positioning the back side of the second semiconductor chip or wafer relative to a face side of the first semiconductor chip or wafer; - bonding the second semiconductor chip or wafer to the first semiconductor chip or wafer by applying pressure and heat; - removing the membrane of parylene by directional etching; and - electrically connecting the face side of the second semiconductor chip or wafer to the face side of the first semiconductor chip or wafer by depositing a conductor inside the hole, thereby obtaining the TSV.