-
公开(公告)号:US20240339345A1
公开(公告)日:2024-10-10
申请号:US18749201
申请日:2024-06-20
Applicant: EPISTAR CORPORATION
Inventor: Min-Hsun HSIEH , De-Shan KUO , Chang-Lin LEE , Jhih-Yong YANG
IPC: H01L21/677 , H01L21/67 , H01L21/683 , H01L33/00
CPC classification number: H01L21/67721 , H01L21/67144 , H01L21/67288 , H01L21/6773 , H01L21/6836 , H01L33/0075 , H01L2221/68322 , H01L2221/68354 , H01L2221/68368
Abstract: A chip transferring method includes steps of: providing a plurality of chips on a first load-bearing structure; measuring photoelectric characteristic values of the plurality of chips; categorizing the plurality of chips into a first portion of the plurality of chips and a second portion of the plurality of chips according to the photoelectric characteristic values of the plurality of chips, wherein the second portion of the plurality of chips comprise parts of the plurality of chips which photoelectric characteristic value falls within an unqualified range; removing the second portion of the plurality of chips from the first load-bearing structure; dividing the first portion of the plurality of chips into a plurality of blocks, wherein each of the plurality of blocks comprising multiple chips of the first portion of the plurality of chips; and transferring the first portion of the plurality of chips in one of the plurality of blocks to a second load-bearing structure in single-batch.
-
公开(公告)号:US20240258455A1
公开(公告)日:2024-08-01
申请号:US18636292
申请日:2024-04-16
Applicant: EPISTAR CORPORATION
Inventor: Min-Hsun HSIEH , Chang-Lin LEE
IPC: H01L33/00 , H01L25/075
CPC classification number: H01L33/0095 , H01L25/0753
Abstract: A method of processing light-emitting elements includes: placing a plurality of LED dies from original wafers or trays on each trays of a next-stage carrier, based on a predetermined pattern. The predetermined pattern arranges two adjacent LED groups in a first direction on the original wafer or trays to be placed on two non-adjacent positions in the first direction on the tray of the next-stage carrier. The LED dies on the original wafer or trays have a first horizontal pitch and a first vertical pitch. The LED dies on each tray of the next-stage carrier have a second horizontal pitch and a second vertical pitch. The second horizontal pitch is greater than the first horizontal pitch, or the second vertical pitch is greater than the first vertical pitch. Besides, a light-emitting element device using the aforementioned method is also provided.
-
公开(公告)号:US20230274962A1
公开(公告)日:2023-08-31
申请号:US18143413
申请日:2023-05-04
Applicant: EPISTAR CORPORATION
Inventor: Min-Hsun HSIEH , De-Shan KUO , Chang-Lin LEE , Jhih-Yong YANG
IPC: H01L21/677 , H01L33/00 , H01L21/683 , H01L21/67
CPC classification number: H01L21/67721 , H01L21/67144 , H01L21/67288 , H01L21/6773 , H01L21/6836 , H01L33/0075 , H01L2221/68322 , H01L2221/68354 , H01L2221/68368
Abstract: A chip transferring method includes providing a plurality of chips on a first load-bearing structure; measuring photoelectric characteristic values of the plurality of chips; categorizing the plurality of chips into a first portion chips and a second portion chips according to the photoelectric characteristic values of the plurality of chips, wherein the second portion chips comprise parts of the plurality of chips which photoelectric characteristic value falls within an unqualified range; removing the second portion chips from the first load-bearing structure; dividing the first portion chips into a plurality of blocks according to the photoelectric characteristic values, and each of the plurality of blocks comprising multiple chips of the first portion chips; and transferring the multiple chips of one of the plurality of blocks to a second load-bearing structure.
-
公开(公告)号:US20210335641A1
公开(公告)日:2021-10-28
申请号:US17367067
申请日:2021-07-02
Applicant: EPISTAR CORPORATION
Inventor: Min-Hsun HSIEH , De-Shan KUO , Chang-Lin LEE , Jhih-Yong YANG
IPC: H01L21/677 , H01L33/00 , H01L21/683 , H01L21/67
Abstract: A chip transferring method includes providing a plurality of chips on a first load-bearing structure; measuring a photoelectric characteristic value of each of the plurality of chips; categorizing the plurality of chips into a first portion chips and a second portion chips according to the photoelectric characteristic value of each of the plurality of chips; providing a second load-bearing structure; weakening a first adhesion between the first portion chips and the first load-bearing structure or between the second portion chips and the first load-bearing structure; and transferring the first portion chips or the second portion chips to the second load-bearing structure.
-
公开(公告)号:US20200295225A1
公开(公告)日:2020-09-17
申请号:US16817621
申请日:2020-03-13
Applicant: EPISTAR CORPORATION
Inventor: Min-Hsun HSIEH , Chang-Lin LEE
IPC: H01L33/00 , H01L25/075
Abstract: A method of processing light-emitting elements includes: transferring a plurality of light-emitting elements from original wafers or next-stage carriers, based on a predetermined pattern. The predetermined pattern arranges two adjacent LED groups in a first direction on the original wafer or carriers to be placed on two non-adjacent positions in the first direction on the next-stage carriers. The light-emitting elements on the original wafer have a horizontal wafer pitch and a vertical wafer pitch. The light-emitting elements on each of the next-stage carriers have a first horizontal pitch and a first vertical pitch. The first horizontal pitch is greater than the horizontal wafer pitch, or the first vertical pitch is greater than the vertical wafer pitch. Besides, a light-emitting element device using the aforementioned method is also provided.
-
公开(公告)号:US20190229001A1
公开(公告)日:2019-07-25
申请号:US16257886
申请日:2019-01-25
Applicant: EPISTAR CORPORATION
Inventor: Min-Hsun HSIEH , De-Shan KUO , Chang-Lin LEE , Jhih-Yong YANG
IPC: H01L21/677 , H01L21/683 , H01L33/00
Abstract: A transferring chips method, including providing a plurality of chips on a first load-bearing structure; dividing the first load-bearing structure into a plurality of blocks, and each of the plurality of blocks including multiple chips of the plurality of chips; measuring a characteristic value of each of the plurality of chips; respectively calculating an average characteristic value of each of the plurality of blocks based on the characteristic values of the multiple chips of each of the plurality of blocks; and transferring the multiple chips of at least two blocks of the plurality of blocks with the average characteristic values within the same range to a second load-bearing structure.
-
-
-
-
-