2.
    发明专利
    未知

    公开(公告)号:DE60132551D1

    公开(公告)日:2008-03-13

    申请号:DE60132551

    申请日:2001-08-17

    Applicant: ESSILOR INT

    Abstract: A method for measuring the geometrical structure of an optical component ( 2 ) in transmission, comprises illuminating the optical component by means of a first incident beam ( 8, 10 ), the wavefront of which is known. After the first beam is transmitted by the optical component, its wavefront is measured by deflectometry ( 16, 18 ). The optical component is then illuminated by a second incident beam ( 12, 14 ), the wavefront of which is known. After the second beam is transmitted by the optical component, its wavefront is measured by deflectometry ( 16, 18 ). The geometrical structure of the optical component is then calculated from the measured wavefronts. Measuring light transmitted in two distinct optical configurations allows a calculation by optimizing the two surfaces of the component, without prior knowledge of one of the surfaces. The first and second beams may be different and may illuminate the same surface of the component; thus it is possible to use identical beams and to illuminate each surface of the component in succession.

    4.
    发明专利
    未知

    公开(公告)号:FR2813391B1

    公开(公告)日:2002-11-29

    申请号:FR0010794

    申请日:2000-08-22

    Applicant: ESSILOR INT

    Abstract: A method for measuring the geometrical structure of an optical component ( 2 ) in transmission, comprises illuminating the optical component by means of a first incident beam ( 8, 10 ), the wavefront of which is known. After the first beam is transmitted by the optical component, its wavefront is measured by deflectometry ( 16, 18 ). The optical component is then illuminated by a second incident beam ( 12, 14 ), the wavefront of which is known. After the second beam is transmitted by the optical component, its wavefront is measured by deflectometry ( 16, 18 ). The geometrical structure of the optical component is then calculated from the measured wavefronts. Measuring light transmitted in two distinct optical configurations allows a calculation by optimizing the two surfaces of the component, without prior knowledge of one of the surfaces. The first and second beams may be different and may illuminate the same surface of the component; thus it is possible to use identical beams and to illuminate each surface of the component in succession.

    5.
    发明专利
    未知

    公开(公告)号:AT384940T

    公开(公告)日:2008-02-15

    申请号:AT01965331

    申请日:2001-08-17

    Applicant: ESSILOR INT

    Abstract: A method for measuring the geometrical structure of an optical component ( 2 ) in transmission, comprises illuminating the optical component by means of a first incident beam ( 8, 10 ), the wavefront of which is known. After the first beam is transmitted by the optical component, its wavefront is measured by deflectometry ( 16, 18 ). The optical component is then illuminated by a second incident beam ( 12, 14 ), the wavefront of which is known. After the second beam is transmitted by the optical component, its wavefront is measured by deflectometry ( 16, 18 ). The geometrical structure of the optical component is then calculated from the measured wavefronts. Measuring light transmitted in two distinct optical configurations allows a calculation by optimizing the two surfaces of the component, without prior knowledge of one of the surfaces. The first and second beams may be different and may illuminate the same surface of the component; thus it is possible to use identical beams and to illuminate each surface of the component in succession.

    9.
    发明专利
    未知

    公开(公告)号:DE60132551T2

    公开(公告)日:2009-01-22

    申请号:DE60132551

    申请日:2001-08-17

    Applicant: ESSILOR INT

    Abstract: A method for measuring the geometrical structure of an optical component ( 2 ) in transmission, comprises illuminating the optical component by means of a first incident beam ( 8, 10 ), the wavefront of which is known. After the first beam is transmitted by the optical component, its wavefront is measured by deflectometry ( 16, 18 ). The optical component is then illuminated by a second incident beam ( 12, 14 ), the wavefront of which is known. After the second beam is transmitted by the optical component, its wavefront is measured by deflectometry ( 16, 18 ). The geometrical structure of the optical component is then calculated from the measured wavefronts. Measuring light transmitted in two distinct optical configurations allows a calculation by optimizing the two surfaces of the component, without prior knowledge of one of the surfaces. The first and second beams may be different and may illuminate the same surface of the component; thus it is possible to use identical beams and to illuminate each surface of the component in succession.

    PROCEDIMIENTO Y APARATO DE MEDICION POR TRANSMISION DE LA ESTRUCTURA GEOMETRICA DE UN COMPONENTE OPTICO.

    公开(公告)号:ES2300355T3

    公开(公告)日:2008-06-16

    申请号:ES01965331

    申请日:2001-08-17

    Applicant: ESSILOR INT

    Abstract: Procedimiento de medición por transmisión de la estructura geométrica de un componente óptico (2), que comprende las etapas: - de iluminación del componente óptico con una primera luz incidente (8, 10), cuyo frente de onda es conocido, - de medición (16, 18) del frente de onda de dicha primera luz tras la transmisión por dicho componente óptico, - de iluminación del componente óptico con una segunda luz incidente (12, 14), cuyo frente de onda es conocido, - de medición (16, 18) del frente de onda de dicha segunda luz tras la transmisión por dicho componente óptico, - de cálculo de la estructura geométrica de dicho componente óptico a partir de los frentes de ondas medidos en dichas etapas de medición.

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