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公开(公告)号：CA2994497C
公开(公告)日：2020-08-18
申请号：CA2994497
申请日：2016-08-04
Applicant: ESSILOR INT
Inventor： GUEU STEPHANE , CARRIER JEAN
Abstract: Method for determining a parameter of an optical equipment, the method comprising: -an optical equipment positioning step, during which an optical equipment comprising a pair of optical lenses mounted on a spectacle frame is positioned in a first position, -a portable electronic device positioning step, during which a portable electronic device comprising an image acquisition module is positioned in a second position determined and/or known relatively to the first position so as to acquire an image of a distant element seen through at least part of the optical lenses of the optical equipment in the first position, -a parameter determining step, during which at least one optical parameter of the optical equipment is determined based on the image of a distant element seen through at least part of the optical lenses of the optical equipment in the first position.
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公开(公告)号：AU2012395916B2
公开(公告)日：2017-12-21
申请号：AU2012395916
申请日：2012-12-04
Applicant: ESSILOR INT
Inventor： POPHILLAT OLIVIER , GUEU STEPHANE
Abstract: An eyeglass support is adapted for pinch-holding the eyeglass (5) between three first contact portions (41-43) and three second contact portions (61-63). The first contact portions form a height reference for positioning the eyeglass whereas the second contact portions ensure application of the eyeglass against the first contact portions while conforming to any possible shape for the eyeglass. The support suits for being incorporated in a reflection measurement apparatus. In particular, it is useful for measuring reflection of eyeglasses provided with antireflecting coatings or for rating a protection against UV hazards which is provided by an eyeglass to a wearer of said eyeglass.
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公开(公告)号：CA2893437A1
公开(公告)日：2014-06-12
申请号：CA2893437
申请日：2012-12-04
Applicant: ESSILOR INT
Inventor： POPHILLAT OLIVIER , GUEU STEPHANE
Abstract: An eyeglass support is adapted for pinch-holding the eyeglass (5) between three first contact portions (41-43) and three second contact portions (61-63). The first contact portions form a height reference for positioning the eyeglass whereas the second contact portions ensure application of the eyeglass against the first contact portions while conforming to any possible shape for the eyeglass. The support suits for being incorporated in a reflection measurement apparatus. In particular, it is useful for measuring reflection of eyeglasses provided with antireflecting coatings or for rating a protection against UV hazards which is provided by an eyeglass to a wearer of said eyeglass.
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公开(公告)号：CA2864866C
公开(公告)日：2020-07-07
申请号：CA2864866
申请日：2013-03-08
Applicant: ESSILOR INT
Inventor： GUEU STEPHANE , LAVILLONNIERE NICOLAS , MURADORE FABIEN , LAKHOUA ASMA
Abstract: La présente invention a pour objet un procédé et un système de mesure de la structure géométrique ou optique d'un composant optique. En particulier, l'invention concerne un procédé de mesure de la structure géométrique d'un composant délimité par une première face (10) et une deuxième face (20); ledit procédé comprenant les étapes de: - (S1) Mesure d'un premier signal (MS1) résultant d'une première transformation d'un premier signal sonde (PS1) par au moins ladite première face (10); - (S2) Mesure d'un deuxième signal (MS2) résultant d'une deuxième transformation d'un deuxième signal sonde (PS2) par au moins ladite deuxième face (20); - (S3) Détermination d'une troisième transformation permettant de passer d'un premier repère (R1) lié à la mesure du premier signal (MS1) à un deuxième repère (R2) lié à la mesure du deuxième signal (MS2); - (S10) Estimation de ladite première face (10) réalisée à partir du premier signal (MS1), de ladite première simulation et d'un premier critère de coût (V1) quantifiant un écart entre l'estimation (ES1) et le premier signal (MS1); - (S20) Estimation de ladite deuxième face (20) réalisée à partir du deuxième signal (MS2), de ladite deuxième simulation, de ladite troisième transformation et d'un deuxième critère de coût (V2) quantifiant un écart entre l'estimation (ES2) et le deuxième signal (MS2).
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公开(公告)号：CA2864866A1
公开(公告)日：2013-09-12
申请号：CA2864866
申请日：2013-03-08
Applicant: ESSILOR INT
Inventor： GUEU STEPHANE , LAVILLONNIERE NICOLAS , MURADORE FABIEN , LAKHOUA ASMA
Abstract: La présente invention a pour objet un procédé et un système de mesure de la structure géométrique ou optique d'un composant optique. En particulier, l'invention concerne un procédé de mesure de la structure géométrique d'un composant délimité par une première face (10) et une deuxième face (20); ledit procédé comprenant les étapes de: - (S1) Mesure d'un premier signal (MS1) résultant d'une première transformation d'un premier signal sonde (PS1) par au moins ladite première face (10); - (S2) Mesure d'un deuxième signal (MS2) résultant d'une deuxième transformation d'un deuxième signal sonde (PS2) par au moins ladite deuxième face (20); - (S3) Détermination d'une troisième transformation permettant de passer d'un premier repère (R1) lié à la mesure du premier signal (MS1) à un deuxième repère (R2) lié à la mesure du deuxième signal (MS2); - (S10) Estimation de ladite première face (10) réalisée à partir du premier signal (MS1), de ladite première simulation et d'un premier critère de coût (V1) quantifiant un écart entre l'estimation (ES1) et le premier signal (MS1); - (S20) Estimation de ladite deuxième face (20) réalisée à partir du deuxième signal (MS2), de ladite deuxième simulation, de ladite troisième transformation et d'un deuxième critère de coût (V2) quantifiant un écart entre l'estimation (ES2) et le deuxième signal (MS2).
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Patent Agency Ranking
公开(公告)号：CA2893437C
公开(公告)日：2019-11-26
申请号：CA2893437
申请日：2012-12-04
Applicant: ESSILOR INT
Inventor： POPHILLAT OLIVIER , GUEU STEPHANE
Abstract: An eyeglass support is adapted for pinch-holding the eyeglass (5) between three first contact portions (41-43) and three second contact portions (61-63). The first contact portions form a height reference for positioning the eyeglass whereas the second contact portions ensure application of the eyeglass against the first contact portions while conforming to any possible shape for the eyeglass. The support suits for being incorporated in a reflection measurement apparatus. In particular, it is useful for measuring reflection of eyeglasses provided with antireflecting coatings or for rating a protection against UV hazards which is provided by an eyeglass to a wearer of said eyeglass.
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公开(公告)号：CA2994497A1
公开(公告)日：2017-02-09
申请号：CA2994497
申请日：2016-08-04
Applicant: ESSILOR INT
Inventor： GUEU STEPHANE , CARRIER JEAN
Abstract: Method for determining a parameter of an optical equipment, the method comprising: -an optical equipment positioning step, during which an optical equipment comprising a pair of optical lenses mounted on a spectacle frame is positioned in a first position, -a portable electronic device positioning step, during which a portable electronic device comprising an image acquisition module is positioned in a second position determined and/or known relatively to the first position so as to acquire an image of a distant element seen through at least part of the optical lenses of the optical equipment in the first position, -a parameter determining step, during which at least one optical parameter of the optical equipment is determined based on the image of a distant element seen through at least part of the optical lenses of the optical equipment in the first position.
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公开(公告)号：AU2013229379B2
公开(公告)日：2016-11-24
申请号：AU2013229379
申请日：2013-03-08
Applicant: ESSILOR INT
Inventor： GUEU STEPHANE , LAVILLONNIERE NICOLAS , MURADORE FABIEN , LAKHOUA ASMA
Abstract: The subject of the present invention is a method and a system for measuring the geometric or optical structure of an optical component. In particular, the invention relates to a method for measuring the geometric structure of a component bounded by a first side (10) and a second side (20), said method comprising steps of: (S1) measuring a first signal (MS1) resulting from a first conversion of a first probe signal (PS1), by at least said first side (10); (S2) measuring a second signal (MS2) resulting from a second conversion of a second probe signal (PS2), by at least said second side (20); (S3) determining a third conversion making it possible to convert a first set of coordinates (R1) associated with the measurement of the first signal (MS1) to a second set of coordinates (R2) associated with the measurement of the second signal (MS2); (S10) estimating said first side (10) using the first signal (MS1), said first simulation and a first cost criterion (V1) quantifying a difference between the estimation (ES1) and the first signal (MS1); and (S20) estimating said second side (20) using the second signal (MS2), said second simulation, said third conversion and a second cost criterion (V2) quantifying a difference between the estimation (ES2) and the second signal (MS2).
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公开(公告)号：AU2012395916A1
公开(公告)日：2015-06-11
申请号：AU2012395916
申请日：2012-12-04
Applicant: ESSILOR INT
Inventor： POPHILLAT OLIVIER , GUEU STEPHANE
Abstract: An eyeglass support is adapted for pinch-holding the eyeglass (5) between three first contact portions (41-43) and three second contact portions (61-63). The first contact portions form a height reference for positioning the eyeglass whereas the second contact portions ensure application of the eyeglass against the first contact portions while conforming to any possible shape for the eyeglass. The support suits for being incorporated in a reflection measurement apparatus. In particular, it is useful for measuring reflection of eyeglasses provided with antireflecting coatings or for rating a protection against UV hazards which is provided by an eyeglass to a wearer of said eyeglass.
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公开(公告)号：AU2013229379A1
公开(公告)日：2014-09-04
申请号：AU2013229379
申请日：2013-03-08
Applicant: ESSILOR INT
Inventor： GUEU STEPHANE , LAVILLONNIERE NICOLAS , MURADORE FABIEN , LAKHOUA ASMA
Abstract: The subject of the present invention is a method and a system for measuring the geometric or optical structure of an optical component. In particular, the invention relates to a method for measuring the geometric structure of a component bounded by a first side (10) and a second side (20), said method comprising steps of: (S1) measuring a first signal (MS1) resulting from a first conversion of a first probe signal (PS1), by at least said first side (10); (S2) measuring a second signal (MS2) resulting from a second conversion of a second probe signal (PS2), by at least said second side (20); (S3) determining a third conversion making it possible to convert a first set of coordinates (R1) associated with the measurement of the first signal (MS1) to a second set of coordinates (R2) associated with the measurement of the second signal (MS2); (S10) estimating said first side (10) using the first signal (MS1), said first simulation and a first cost criterion (V1) quantifying a difference between the estimation (ES1) and the first signal (MS1); and (S20) estimating said second side (20) using the second signal (MS2), said second simulation, said third conversion and a second cost criterion (V2) quantifying a difference between the estimation (ES2) and the second signal (MS2).
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