公开(公告)号：DE69402281D1

公开(公告)日：1997-04-30

申请号：DE69402281

申请日：1994-09-02

Applicant: ESSILOR INT

Inventor： LE SAUX GILLES ,  BERTRAND PATRICK ,  LIPPENS XAVIER ,  LAFAY CHRISTOPHE

IPC: G01B11/255 ,  G01B11/24 ,  G01M11/00 ,  G01M11/02

Abstract: The invention relates to a method for absolute measurement of the geometrical or optical structure of an optical component (4), comprising steps consisting in: - illuminating the said optical component with incident light, the wavefront of which is known, - measuring, in a given plane, the maps of the slopes of the wavefront of the said light after reflection from the said optical component or transmission by the said optical component, which furthermore comprises at least one calculation procedure consisting in deducing the geometrical or optical structure of the optical component from the said measurement of the slope maps. A further subject of the invention is a device for implementing this method. The invention is applied in particular in the field of ophthalmology for checking or measuring ophthalmic lenses or moulds for fabricating ophthalmic lenses.

公开(公告)号：DE69402281T2

公开(公告)日：1997-09-04

申请号：DE69402281

申请日：1994-09-02

Applicant: ESSILOR INT

Inventor： LE SAUX GILLES ,  BERTRAND PATRICK ,  LIPPENS XAVIER ,  LAFAY CHRISTOPHE

IPC: G01B11/255 ,  G01B11/24 ,  G01M11/00 ,  G01M11/02

Abstract: The invention relates to a method for absolute measurement of the geometrical or optical structure of an optical component (4), comprising steps consisting in: - illuminating the said optical component with incident light, the wavefront of which is known, - measuring, in a given plane, the maps of the slopes of the wavefront of the said light after reflection from the said optical component or transmission by the said optical component, which furthermore comprises at least one calculation procedure consisting in deducing the geometrical or optical structure of the optical component from the said measurement of the slope maps. A further subject of the invention is a device for implementing this method. The invention is applied in particular in the field of ophthalmology for checking or measuring ophthalmic lenses or moulds for fabricating ophthalmic lenses.

公开(公告)号：ES2101465T3

公开(公告)日：1997-07-01

申请号：ES94401959

申请日：1994-09-02

Applicant: ESSILOR INT

Inventor： LE SAUX GILLES ,  BERTRAND PATRICK ,  LIPPENS XAVIER ,  LAFAY CHRISTOPHE

IPC: G01B11/255 ,  G01M11/00 ,  G01B11/24 ,  G01M11/02

Abstract: The invention relates to a method for absolute measurement of the geometrical or optical structure of an optical component (4), comprising steps consisting in: - illuminating the said optical component with incident light, the wavefront of which is known, - measuring, in a given plane, the maps of the slopes of the wavefront of the said light after reflection from the said optical component or transmission by the said optical component, which furthermore comprises at least one calculation procedure consisting in deducing the geometrical or optical structure of the optical component from the said measurement of the slope maps. A further subject of the invention is a device for implementing this method. The invention is applied in particular in the field of ophthalmology for checking or measuring ophthalmic lenses or moulds for fabricating ophthalmic lenses.

公开(公告)号：FR2710162B1

公开(公告)日：1995-11-17

申请号：FR9311136

申请日：1993-09-17

Applicant: ESSILOR INT

Inventor： LE SAUX GILLES ,  BERTRAND PATRICK ,  LIPPENS XAVIER ,  LAFAY CHRISTOPHE

IPC: G01M11/02 ,  G02B27/46 ,  G01B11/24