公开(公告)号：AT548747T

公开(公告)日：2012-03-15

申请号：AT08782363

申请日：2008-07-25

Applicant: GEN ELECTRIC

Inventor： SRIDHAR MANDYAM ,  VENUGOPAL MANOHARAN ,  MISHRA DEBASISH ,  SEBASTIAN SAVIO ,  VADARI HARITH ,  FRONTERA MARK

IPC: H01J35/28

Abstract: An X-ray tube anode assembly, an X-ray tube assembly and a method for heat management to an X-ray assembly having a movable X-ray target having a target surface. The anode assembly includes a drive member arranged and disposed to provide oscillatory motion to the target assembly and a target surface that is configured to remain at a substantially fixed distance from a cathode assembly during oscillatory motion.

公开(公告)号：BRPI1102867A2

公开(公告)日：2012-12-04

申请号：BRPI1102867

申请日：2011-06-09

Applicant: GEN ELECTRIC

Inventor： LANGOJU RAJESH VEERA VENKATA LAKSHMI ,  MISHRA DEBASISH ,  MEETHAL MANOJ KUMAR KOYITHITTA ,  MAHALINGAM SAKETHRAMAN

IPC: A61B5/05 ,  G01R27/00

Abstract: A method of providing an image of an interior of a structure (46) containing regions having different conductivities or admittivities. In one embodiment a series of electrical signal sets (V i ) is applied to a series of electrodes, each signal set generating a rotating electric field. A measured set of electrical signals obtained from the electrodes (44) is used to calculate a conductivity or admittivity distribution representative of the interior of the structure in a region about which the electrodes (44) are positioned. The process of calculating the distribution includes defining a cost function, e.g., the energy function based on the distribution, and a forward model expressing the measured set of electrical signals as a function of the change in voltage values with respect to conductivity or admittivity and requiring that the partial derivative of the difference between the energy function and a function based on the forward model equal zero.

公开(公告)号：SG10202100437WA

公开(公告)日：2021-08-30

申请号：SG10202100437W

申请日：2021-01-14

Applicant: GEN ELECTRIC

Inventor： POORNIMA RAJANI M ,  BOLISETTI S V RAJ KUMAR ,  KUMARASWAMY ASHOK ,  TATIPARTHI VISHNU ,  NARAYANAN LAKSHMY ,  KOMMAREDDY; VAMSHI KRISHNA REDDY ,  BHAKTA ADITYA ,  MOVVA RAJA ,  MISHRA DEBASISH

Abstract: There are provided methods and systems (500) for assessing the health of an asset (511). For example, a system (500) is provided. The system (500) may include a processor (514) and a memory (502) including instructions (518) that, when executed by the processor (514), cause the processor (514) to perform operations consistent with identifying a defect (513) in a component (501) of an asset (511). The operations may include fetching from an inspection system (503), a plurality of images (104) acquired from an inspection of the component (501) of the asset (511) by the inspection system (503). The operations may include identifying, based on an image processing technique codified and included as part of the instructions (518), a subset of images (110) from the plurality of images (104). The subset of images (110) is representative of the defect (513) in the component (501) of the asset (511), and the image processing technique is selected from the group consisting of an auto-distress ranking technique, a structural similarity technique, a mean-subtracted filtering technique, and a Hessian norm computation technique.

公开(公告)号：CA2743375A1

公开(公告)日：2011-12-29

申请号：CA2743375

申请日：2011-06-16

Applicant: GEN ELECTRIC

Inventor： JEYARAMAN SATHEESH ,  HARDING KEVIN GEORGE ,  SENGUPTA ANANDRAJ ,  MISHRA DEBASISH ,  SHANKARAPPA SUNEEL TUMKUR ,  WEAVER HOWARD PAUL ,  MEYER KEVIN WILLIAM

IPC: B23Q17/09

Abstract: A portable wear quantification system includes a hand-held image acquisition device and a fixture. The fixture includes a first end coupled to the image acquisition device. A light source emits a light beam along an emission axis. A beam splitter is disposed at an angle with respect to an axis of view of the image acquisition device for directing the beam from the light source toward a portion of an object. A second end of the fixture is located on an opposite side of the beam splitter from the first end. The second end includes a platform that is configured to position the fixture with respect to the object. A channel extends from the first end to the second end along the axis of view of the image acquisition device.