公开(公告)号：SG10202100437WA

公开(公告)日：2021-08-30

申请号：SG10202100437W

申请日：2021-01-14

Applicant: GEN ELECTRIC

Inventor： POORNIMA RAJANI M ,  BOLISETTI S V RAJ KUMAR ,  KUMARASWAMY ASHOK ,  TATIPARTHI VISHNU ,  NARAYANAN LAKSHMY ,  KOMMAREDDY; VAMSHI KRISHNA REDDY ,  BHAKTA ADITYA ,  MOVVA RAJA ,  MISHRA DEBASISH

Abstract: There are provided methods and systems (500) for assessing the health of an asset (511). For example, a system (500) is provided. The system (500) may include a processor (514) and a memory (502) including instructions (518) that, when executed by the processor (514), cause the processor (514) to perform operations consistent with identifying a defect (513) in a component (501) of an asset (511). The operations may include fetching from an inspection system (503), a plurality of images (104) acquired from an inspection of the component (501) of the asset (511) by the inspection system (503). The operations may include identifying, based on an image processing technique codified and included as part of the instructions (518), a subset of images (110) from the plurality of images (104). The subset of images (110) is representative of the defect (513) in the component (501) of the asset (511), and the image processing technique is selected from the group consisting of an auto-distress ranking technique, a structural similarity technique, a mean-subtracted filtering technique, and a Hessian norm computation technique.