Method and apparatus for eliminating and compensating thermal transients in gas analyzer
    2.
    发明公开
    Method and apparatus for eliminating and compensating thermal transients in gas analyzer 审中-公开
    用于在气体分析仪消除和平衡的热补偿电流的方法和装置

    公开(公告)号:EP1605252A3

    公开(公告)日:2006-01-18

    申请号:EP05104641.5

    申请日:2005-05-31

    Abstract: The invention concerns a gas analyzer comprising: a measuring volume (2), a radiation source (1) for providing a beam to pass said measuring volume; a heat sink (16) for said radiation source; at least one thermal detector (3) having a hot junction within a support structure and receiving the radiation and a cold junction for reference within the same support structure and protected from said radiation; at least one optical bandpass filter (9) between said hot junction and said radiation source; and a thermal mass (11), which is formed of a material having high thermal conductance. The thermal mass has a cavity with a bottom step (34) and a rim (32), and a first length therebetween. The support structure has a frontal edge (35) and a base plate lip (33), and a second length therebetween. There is a radial gap between the thermal mass and the support structure. Press means urge said support structure in the cavity, whereupon a more efficient thermal contact is either between said frontal edge and said bottom step, or between said base plate lip and said rim. A first thermal barrier (17) is between the heat sink and the thermal mass, and a second thermal barrier (22) surrounds the thermal mass. A shield (19) formed of a material having high thermal conductance covers said second thermal barrier and is in thermal contact with said heat sink.

    Method and apparatus for eliminating and compensating thermal transients in gas analyzer
    3.
    发明公开
    Method and apparatus for eliminating and compensating thermal transients in gas analyzer 审中-公开
    用于在气体分析仪消除和平衡的热补偿电流的方法和装置

    公开(公告)号:EP1605252A2

    公开(公告)日:2005-12-14

    申请号:EP05104641.5

    申请日:2005-05-31

    Abstract: The invention concerns a gas analyzer comprising: a measuring volume (2), a radiation source (1) for providing a beam to pass said measuring volume; a heat sink (16) for said radiation source; at least one thermal detector (3) having a hot junction within a support structure and receiving the radiation and a cold junction for reference within the same support structure and protected from said radiation; at least one optical bandpass filter (9) between said hot junction and said radiation source; and a thermal mass (11), which is formed of a material having high thermal conductance. The thermal mass has a cavity with a bottom step (34) and a rim (32), and a first length therebetween. The support structure has a frontal edge (35) and a base plate lip (33), and a second length therebetween. There is a radial gap between the thermal mass and the support structure. Press means urge said support structure in the cavity, whereupon a more efficient thermal contact is either between said frontal edge and said bottom step, or between said base plate lip and said rim. A first thermal barrier (17) is between the heat sink and the thermal mass, and a second thermal barrier (22) surrounds the thermal mass. A shield (19) formed of a material having high thermal conductance covers said second thermal barrier and is in thermal contact with said heat sink.

    Abstract translation: 本发明涉及一种气体分析器,包括:一个测量体积(2),用于提供光束的辐射源(1)通过所述测量体积; 散热器(16),用于所述辐射源; 至少一个热检测器(3),其具有支撑结构内的热接点和接收辐射和冷接点对于相同的支承结构内的参考和来自所述辐射的保护; 所述热结之间的至少一个光学带通滤波器(9)和所述辐射源; 和其上形成具有高导热性的材料制成的热质量(11),全部。 热质量具有带底部的步骤(34)和轮辋(32)之间的第一长度有一个空腔。 所述支撑结构具有前边缘(35)和一个底板唇缘(33)之间,并且第二长度那里。 有热质量和支撑结构之间的径向间隙。 加压装置推动所述支撑结构中的空腔中,其中一旦一个更有效的热接触是要么所述前边缘和所述底部步骤之间,或在所述基板唇和所述边缘。 第一热障(17)是所述散热器和热质量,以及第二热障(22)围绕所述热质量之间。 形成具有高导热性的材料制成的屏蔽(19),覆盖所述第二热障,并与所述热沉热接触。

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