BUILT-IN TEMPERATURE SENSORS
    1.
    发明公开

    公开(公告)号:EP4325188A2

    公开(公告)日:2024-02-21

    申请号:EP23181591.1

    申请日:2023-06-27

    Abstract: The present disclosure relates to semiconductor structures and, more particularly, to built-in temperature sensors and methods of manufacture. The structure includes: at least one active gate structure; and a built-in temperature sensor adjacent to and on a same device level as the at least one active gate structure, the built-in temperature sensor further includes force lines and sensing lines.

    BUILT-IN TEMPERATURE SENSORS
    2.
    发明公开

    公开(公告)号:EP4325188A3

    公开(公告)日:2024-06-19

    申请号:EP23181591.1

    申请日:2023-06-27

    CPC classification number: G01K7/16

    Abstract: The present disclosure relates to semiconductor structures and, more particularly, to built-in temperature sensors and methods of manufacture. The structure includes: at least one active gate structure; and a built-in temperature sensor adjacent to and on a same device level as the at least one active gate structure, the built-in temperature sensor further includes force lines and sensing lines.

    BUILT-IN TEMPERATURE SENSORS
    3.
    发明公开

    公开(公告)号:EP4328961A1

    公开(公告)日:2024-02-28

    申请号:EP23184338.4

    申请日:2023-07-10

    Abstract: The present disclosure relates to semiconductor structures and, more particularly, to built-in temperature sensors and methods of manufacture and operation. The structure includes: a semiconductor on insulator substrate; an insulator layer under the semiconductor on insulator substrate; a handle substrate under insulator layer; a first well of a first dopant type in the handle substrate; a second well of a second dopant type in the handle substrate, adjacent to the first well; and a back-gate diode at a juncture of the first well and the second well.

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