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    Evaluating a drug using attenuated reflection of terahertz radiation
    1.
    发明专利
    Evaluating a drug using attenuated reflection of terahertz radiation 未知

    公开(公告)号：GB2498853A

    公开(公告)日：2013-07-31

    申请号：GB201300501

    申请日：2013-01-11

    Applicant: HAMAMATSU PHOTONICS KK

    Inventor： TAKEBE GEN ,  KAWADA YOICHI ,  AKIYAMA KOUICHIRO

    IPC: G01N21/55 ,  G01N21/35

    Abstract: A drug evaluation device is disclosed in which an absorption spectrum of a drug suspended in a liquid is obtained by an attenuated reflection method using terahertz waves. The presence of an absorption peak in the spectrum is used to determine whether a crystalline substance is suspended in the liquid. The ratio of the suspended crystalline particle may be determined based on the area of the peak. A reference spectrum may be obtained, and the presence of amorphous and/or crystalline particles suspended in the liquid may be determined based on whether the baseline of the spectrum changes compared to the reference. The ratio of the particles may be found based on the amount of change in the baseline. An apparatus comprising a laser light source 2; a separating unit 13 to separate the light into pump light 48 and probe light 49; a terahertz wave generator (32, Fig. 2); a total internal reflection prism (31, Fig. 2), upon which the sample is arranged on a surface (31c, Fig. 2); a terahertz wave detector 33; and units for acquiring 4 and analyzing 6 the data is also disclosed.

    Optischer Bausatz und optische Vorrichtung
    2.
    发明专利
    Optischer Bausatz und optische Vorrichtung 未知

    公开(公告)号：DE112020001501T5

    公开(公告)日：2022-01-05

    申请号：DE112020001501

    申请日：2020-01-14

    Applicant: HAMAMATSU PHOTONICS KK

    Inventor： DOUGAKIUCHI TATSUO ,  KAWADA YOICHI

    IPC: H01S3/101 ,  G02B7/00 ,  G02B27/42 ,  H01S5/14

    Abstract: Ein optischer Bausatz umfasst eine Basis, die eine Hauptfläche aufweist, und eine Halteeinheit, die an der Hauptfläche vorgesehen ist, um ein optisches System zu halten. Die Halteeinheit umfasst eine Linsenhalteeinheit, die eine Linse hält, eine Reflektorhalteeinheit, die einen Eckreflektor hält, eine Erstes-Blendenglied-Halteeinheit, die ein erstes Blendenglied hält, eine Zweites-Blendenglied-Halteeinheit, die ein zweites Blendenglied hält, und eine Drittes-Blendenglied-Halteeinheit, die ein drittes Blendenglied hält. Die Reflektorhalteeinheit enthält einen ersten Mechanismus, der den gesamten Eckreflektor derart hält, dass er entlang der Hauptfläche gedreht werden kann, und einen zweiten Mechanismus, der konfiguriert ist zum Einstellen einer optischen Achse eines gebeugten Lichts in jeweils einem reflexiven Beugungsgitter und einem Spiegel.

    TOTAL REFLECTION SPECTROSCOPIC MEASUREMENT METHOD
    5.
    发明公开
    TOTAL REFLECTION SPECTROSCOPIC MEASUREMENT METHOD 审中-公开
    SPEKTROSKOPISCHES GESAMTREFLEXIONS-MESSVERFAHREN

    公开(公告)号：EP2690426A4

    公开(公告)日：2014-09-03

    申请号：EP12760839

    申请日：2012-02-28

    Applicant: HAMAMATSU PHOTONICS KK

    Inventor： AKIYAMA KOUICHIRO ,  KAWADA YOICHI ,  YASUDA TAKASHI ,  NAKANISHI ATSUSHI ,  TAKAHASHI HIRONORI

    IPC: G01N21/27 ,  G01J3/42 ,  G01N21/35 ,  G01N21/3563 ,  G01N21/3586 ,  G01N21/55 ,  G01N21/552

    CPC classification number: G01J3/42 ,  G01N21/3577 ,  G01N21/3581 ,  G01N21/552

    Abstract: A total reflection measurement method using a total reflection spectrometer 1 is a total reflection measurement method comprising arranging an object to be measured on a total reflection surface 31c of an internal total reflection prism 31 and measuring an optical constant concerning the object 34 according to a terahertz wave totally reflected by the total reflection surface 31c after passing the prism 31, wherein a liquid 50 incapable of dissolving the object 34 is interposed at least between the total reflection surface 31c and the object 34. A force such as an adhesion force acting between the liquid 50 and the object 34 can place the object 34 closer to the total reflection surface 31c, thereby stably generating an interaction between an evanescent component and the object 34.

    Abstract translation: 使用全反射光谱仪1的全反射测量方法是全反射测量方法，包括在内部全反射棱镜31的全反射表面31c上布置被测物体，并根据太赫兹测量关于物体34的光常数 在通过棱镜31之后，全反射面31c全反射的波形，其中不能溶解物体34的液体50至少插入在全反射面31c和物体34之间。诸如作用在物体34之间的粘附力的力 液体50和物体34可以使物体34更靠近全反射面31c，从而稳定地产生ev逝部件与物体34之间的相互作用。

    ELECTROMAGNETIC WAVE DETECTION DEVICE
    6.
    发明公开
    ELECTROMAGNETIC WAVE DETECTION DEVICE 审中-公开

    公开(公告)号：EP2554974A4

    公开(公告)日：2018-01-17

    申请号：EP11762336

    申请日：2011-02-01

    Applicant: HAMAMATSU PHOTONICS KK

    Inventor： KAWADA YOICHI ,  YASUDA TAKASHI ,  TAKAHASHI HIRONORI ,  MATSUMOTO TORU

    IPC: G01N21/35 ,  G01N21/3581 ,  G01N21/21 ,  G01N21/3586

    CPC classification number: G01N21/3581 ,  G01N21/21 ,  G01N21/636

    Abstract: Probe light pulses output from a light source are input to an optical effect unit after the beam diameter thereof is changed by a beam diameter changing optical system, the pulse front thereof is tilted by a pulse front tilting unit, and the beam diameter thereof is adjusted by a beam diameter adjusting optical system. To the optical effect unit, probe light pulses output from the beam diameter adjusting optical system are input, and an electromagnetic wave being an object to be detected is also input. Optical characteristics of the optical effect unit change due to propagation of the electromagnetic wave, and probe light pulses affected by the change in optical characteristics are output from the optical effect unit. The probe light pulses output from the optical effect unit are detected by a photodetector. Accordingly, an electromagnetic wave detection device which allows easily setting each of the pulse front tilt angle and beam diameter of probe light pulses to be input to its optical effect unit to appropriate values is realized.

    TERAHERTZ-WAVE SPECTROMETER
    9.
    发明公开
    TERAHERTZ-WAVE SPECTROMETER 审中-公开
    太赫兹波谱仪

    公开(公告)号：EP2693200A4

    公开(公告)日：2014-09-17

    申请号：EP12764439

    申请日：2012-02-21

    Applicant: HAMAMATSU PHOTONICS KK

    Inventor： YASUDA TAKASHI ,  AKIYAMA KOUICHIRO ,  KAWADA YOICHI ,  NAKANISHI ATSUSHI ,  TAKAHASHI HIRONORI

    IPC: G01N21/35

    CPC classification number: G01J3/42 ,  G01N21/3581

    Abstract: In a terahertz-wave spectrometer 1, a spectroscopic prism 31 is provided with a prism part 52 slidable with respect to a main part 51 thereof. Along the sliding direction, an arrangement surface 31c in an upper face of the prism part 52 is provided with a plurality of arrangement regions K to be arranged with objects to be measured 34. Therefore, after completing the measurement of optical constants for one object 34, the prism part 52 is slid, so as to shift the next object 34 onto an optical path of a terahertz wave T, whereby a plurality of objects 34 can be measured smoothly without cleaning the arrangement surface 31c.

    Abstract translation: 在太赫兹波谱仪1中，分光棱镜31设置有可相对于其主要部分51滑动的棱镜部分52。 沿着滑动方向，棱镜部52的上表面的配置面31c设置有多个配置区域K，配置有被测量对象34 34.因此，在完成对一个物体34的光学常数的测量之后 棱镜部分52滑动，以便将下一个物体34移动到太赫兹波T的光路上，从而能够平滑地测量多个物体34，而不需要清洁布置表面31c。

    TERAHERTZ-WAVE SPECTROMETER AND PRISM MEMBER
    10.
    发明公开
    TERAHERTZ-WAVE SPECTROMETER AND PRISM MEMBER 有权
    太赫兹波光谱仪和棱镜要素

    公开(公告)号：EP2693199A4

    公开(公告)日：2014-09-10

    申请号：EP12763373

    申请日：2012-02-21

    Applicant: HAMAMATSU PHOTONICS KK

    Inventor： YASUDA TAKASHI ,  KAWADA YOICHI ,  NAKANISHI ATSUSHI ,  AKIYAMA KOUICHIRO ,  TAKAHASHI HIRONORI

    IPC: G01N21/35

    CPC classification number: G01J3/42 ,  G01J3/0205 ,  G01N21/3581 ,  G01N21/552

    Abstract: By mating a main part 51 with a first prism part 61 or second prism part, a terahertz-wave spectrometer 1 can easily switch between optical paths of a terahertz wave T propagating within a spectroscopic prism 31. When the main part 51 mates with the first prism part 61, the terahertz wave T incident on an entrance surface 31a passes through a depression 51a, so as to be reflected by an arrangement part 31c, whereby reflection spectrometry can be performed. When the main part 51 mates with the second prism part 71, the terahertz wave T incident on the entrance surface 31a is refracted by the depression 51a, so as to pass through an object 34 to be measured within a groove 71a, whereby transmission spectrometry can be preformed.

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