-
公开(公告)号：DE69943188D1
公开(公告)日：2011-03-24
申请号：DE69943188
申请日：1999-06-03
Applicant: HAMAMATSU PHOTONICS KK
Inventor： OHMAE ETSUKO , UEDA YUKIO , YAMASHITA YUTAKA
-
公开(公告)号：DE69733100D1
公开(公告)日：2005-06-02
申请号：DE69733100
申请日：1997-05-08
Applicant: HAMAMATSU PHOTONICS KK
Inventor： UEDA YUKIO , TSUCHIYA YUTAKA , OHTA KAZUYOSHI
Abstract: A method for measuring an internal property distribution, comprising the steps of: making measurement light incident from a plurality of light incidence positions on a surface of a measured object successively into the object; detecting the measurement light having passed through the object successively or simultaneously at at least one light detection position out of a plurality of light detection positions on the surface of said object and in a predetermined positional relation with respect to a light incidence position at which the measurement light to be measured was incident; obtaining a measured value of a predetermined parameter of said measurement light, based on each measurement light detected at each light detection position; extracting a plurality of said measured values obtained by a plurality of combinations of said light incidence position and said light detection position said positional relation of which is relatively identical and calculating a mean value of the measured values to obtain a reference value in the positional relation; and calculating a change amount of a predetermined internal property in each region of said object divided into a plurality of regions, using said plurality of measured values obtained by said plurality of combinations, and said reference value, thereby obtaining an internal property change amount distribution in the object.
-
公开(公告)号：AU4058999A
公开(公告)日：2000-12-28
申请号：AU4058999
申请日：1999-06-03
Applicant: HAMAMATSU PHOTONICS KK
Inventor： OHMAE ETSUKO , UEDA YUKIO , YAMASHITA YUTAKA
-
公开(公告)号：DE69733100T2
公开(公告)日：2006-03-09
申请号：DE69733100
申请日：1997-05-08
Applicant: HAMAMATSU PHOTONICS KK
Inventor： UEDA YUKIO , TSUCHIYA YUTAKA , OHTA KAZUYOSHI
Abstract: A method for measuring an internal property distribution, comprising the steps of: making measurement light incident from a plurality of light incidence positions on a surface of a measured object successively into the object; detecting the measurement light having passed through the object successively or simultaneously at at least one light detection position out of a plurality of light detection positions on the surface of said object and in a predetermined positional relation with respect to a light incidence position at which the measurement light to be measured was incident; obtaining a measured value of a predetermined parameter of said measurement light, based on each measurement light detected at each light detection position; extracting a plurality of said measured values obtained by a plurality of combinations of said light incidence position and said light detection position said positional relation of which is relatively identical and calculating a mean value of the measured values to obtain a reference value in the positional relation; and calculating a change amount of a predetermined internal property in each region of said object divided into a plurality of regions, using said plurality of measured values obtained by said plurality of combinations, and said reference value, thereby obtaining an internal property change amount distribution in the object.
-
公开(公告)号：AU3058001A
公开(公告)日：2001-08-14
申请号：AU3058001
申请日：2001-02-05
Applicant: HAMAMATSU PHOTONICS KK
Inventor： SATO KATSUHIKO , MORITA NOBUHIRO , UEDA YUKIO , MIZUNO TOSHIHIKO , SAKAMOTO SHIGERU , YAMANAKA KOJI , TANAKA TOSHIYUKI , TAKAHASHI HIDEO , SUYAMA KEIJI , HASHIMOTO SEIICHIRO
-
Patent Agency Ranking
公开(公告)号：DE69525219T2
公开(公告)日：2002-07-18
申请号：DE69525219
申请日：1995-11-07
Applicant: HAMAMATSU PHOTONICS KK
Inventor： MIWA MITSUHARU , TSUCHIYA YUTAKA , UEDA YUKIO
Abstract: A method for mesuring a scattering property and an absorption property in a scattering medium according to the present invention comprises: (a) a first step of letting pulsed measuring light having a predetermined wavelength enter a scattering medium; (b) a second step of performing time-resolved measurement of the measuring light having diffusively propagated in the scattering medium at light detection positions corresponding to a plurality of combinations, each comprised of a light incidence position on the scattering medium where the measuring light was let to enter the scattering medium in the first step and a light detection position on the scattering medium where the measuring light is detected, having different incidence-detection distances between the light incidence position and the light detection position; (c) a third step of calculating a plurality of mean optical pathlengths of the measuring light corresponding to the plurality of incidence-detection distances, based on results of the time-resolved measurement measured in the second step; and (d) a fourth step of calculating a scattering coefficient and an absorption coefficient in the scattering medium, based on a plurality of simultaneous relations consisting of calculation values of the plurality of mean optical pathlengths corresponding to the incidence-detection distances, calculated in the third step, and a theoretical equation of the mean optical pathlengths derived in correspondence to light diffusion properties comprising a scattering property and an absorption property in diffusive propagation paths in the scattering medium.
-
公开(公告)号：GB2309368B
公开(公告)日：1999-09-15
申请号：GB9700934
申请日：1997-01-17
Applicant: HAMAMATSU PHOTONICS KK
Inventor： OHTA KAZUYOSHI , UEDA YUKIO
-
公开(公告)号：DE102017216583A1
公开(公告)日：2018-03-29
申请号：DE102017216583
申请日：2017-09-19
Applicant: HAMAMATSU PHOTONICS KK
Inventor： YAMASHITA DAISUKE , YAMASHITA YUTAKA , UEDA YUKIO , TAMAOKI YOSHINORI
Abstract: Eine Vorrichtung zum Abstrahlen von gepulstem Licht in Richtung von einem Thrombus in einem Blutgefäß, wobei die Überwachungsvorrichtung umfasst eine Lichtausgabeeinheit zum Ausgeben von Überwachungslicht, das in das Blutgefäß ausgestrahlt werden soll, eine Lichterfassungseinheit zum Erfassen von Rückkehrlicht des Überwachungslichts und zum Ausgeben eines Erfassungssignals, und eine Auswerteeinheit zum Erlangen einer Zeit-Wellenform, die eine Änderung der intensität des Rückkehrlichts über die Zeit ist, auf der Basis des Erfassungssignals, wobei die Auswerteeinheit einen Parameter auf der Basis der Zeit-Wellenform erhält und eine Reaktion in dem Blutgefäß gemäß der Strahlung des gepulsten Lichts auf Basis des Parameters auswertet.
-
公开(公告)号：GB2522558A
公开(公告)日：2015-07-29
申请号：GB201501343
申请日：2013-06-27
Applicant: UNIV TSUKUBA , HAMAMATSU PHOTONICS KK
Inventor： KUDO HIROYUKI , SAITO NAOYA , UEDA YUKIO , YOSHIMOTO KENJI , YAMASHITA YUTAKA
IPC: A61B5/00
Abstract: This measurement data selection method: treats a vector comprising measurement data y1 to yN1 obtained for each combination among a plurality of light exit positions, a plurality of light detection positions, and a plurality of time slices in a time-resolved waveform as (1); treats a vector, which has pixel values of learning-use image data prepared beforehand as examples of internal image data as components, as x; and treats a system matrix for calculating the internal image data on the basis of the measurement data y1 to yN1 as A1. Then, a vector y which satisfies the following conditional expressions (2) and (3) or which satisfies the following conditional expression (4) is obtained by back-calculation. When measuring a subject, the internal image data are created using only measurement data corresponding to non-zero components of the vector y.
-
公开(公告)号：DE112013003284T5
公开(公告)日：2015-04-30
申请号：DE112013003284
申请日：2013-06-27
Applicant: HAMAMATSU PHOTONICS KK , UNIV TSUKUBA
Inventor： KUDO HIROYUKI , SAITO NAOYA , YOSHIMOTO KENJI , YAMASHITA YUTAKA , UEDA YUKIO
Abstract: Messdaten-Auswahlverfahren für eine biometrische Vorrichtung, Lichtaustrittspositions-Ermittlungsverfahren für eine biometrische Vorrichtung und biometrische Vorrichtung Wenn bei dem Messdaten-Auswahlverfahren ein Vektor, der sich aus Messdaten y1 bis yN1 zusammensetzt, die für entsprechende Kombinationen einer Vielzahl von Lichtemissionspositionen, einer Vielzahl von Lichterfassungspositionen und einer Vielzahl von Auflösungszeiten in einer zeitaufgelösten Wellenform gewonnen worden sind, gegeben ist durch [Formel 1]ein Vektor, bei dem Bildpunktwerte von Lernbilddaten, die im Voraus als Beispiel für Innenbilddaten bereitgestellt werden, Komponenten sind, durch x gegeben ist und eine Systemmatrix zum Berechnen der Innenbilddaten aus den Messdaten y1 bis yN1 durch A1 gegeben ist, wird der Vektor y, der die folgenden bedingten Ausdrücke (2) und (3) erfüllt [Formel 2] min∥y∥00 (2)[Formel 3] ∥x – A1 Ty∥22 ≤ &egr;2 (3)oder der den folgenden bedingten Ausdruck (4) erfüllt [Formel 4] min(∥y∥00 + &bgr;∥x – A1 Ty∥22 )(4) ...
-
-
-
-
-
-
-
-
-
Search Results
33
records
(took 0.022 seconds)
