公开(公告)号：WO2014189967A8

公开(公告)日：2016-02-04

申请号：PCT/US2014038837

申请日：2014-05-20

Applicant: HINDS INSTRUMENTS INC

Inventor： FREUDENTHAL JOHN ,  LEADBETTER ANDY ,  WANG BAOLIANG

IPC: G01N21/21 ,  G01J4/04 ,  G01N21/23

CPC classification number: G01N21/23 ,  G01J4/00 ,  G01N21/21 ,  G01N2201/0621 ,  G01N2201/0683

Abstract: This disclosure is generally directed to systems for imaging polarization properties of optical-material samples. As one aspect, there is provided a system for precise, simultaneous imaging of both the in-plane and out-of-plane birefringence properties of sample material over a wide range of incidence angles. The spatially resolved imaging approach described here is amenable to determination of a wide range of polarimetric properties, in addition to the inplane and out-of-plane birefringence measure discussed as a preferred embodiment.

Abstract translation: 本公开一般涉及用于对光学材料样品的偏振特性进行成像的系统。 作为一个方面，提供了一种用于在宽的入射角范围内精确地同时成像样品材料的平面内和平面外双折射性质的系统。 除了作为优选实施例讨论的面内和平面外的双折射度量之外，这里描述的空间分辨成像方法适于确定宽范围的偏振特性。

公开(公告)号：WO2014189967A2

公开(公告)日：2014-11-27

申请号：PCT/US2014038837

申请日：2014-05-20

Applicant: HINDS INSTRUMENTS INC

Inventor： FREUDENTHAL JOHN ,  LEADBETTER ANDY ,  WANG BAOLIANG

IPC: G01N21/23

CPC classification number: G01N21/23 ,  G01J4/00 ,  G01N21/21 ,  G01N2201/0621 ,  G01N2201/0683

Abstract: This disclosure is generally directed to systems for imaging polarization properties of optical-material samples. As one aspect, there is provided a system for precise, simultaneous imaging of both the in-plane and out-of-plane birefringence properties of sample material over a wide range of incidence angles. The spatially resolved imaging approach described here is amenable to determination of a wide range of polarimetric properties, in addition to the inplane and out-of-plane birefringence measure discussed as a preferred embodiment.

Abstract translation: 本公开一般涉及用于对光学材料样品的偏振特性进行成像的系统。 作为一个方面，提供了一种用于在宽的入射角范围内精确地同时成像样品材料的平面内和平面外双折射性质的系统。 除了作为优选实施例讨论的面内和平面外的双折射度量之外，这里描述的空间分辨成像方法适于确定宽范围的偏振特性。