公开(公告)号：DE102015101280A1

公开(公告)日：2015-09-24

申请号：DE102015101280

申请日：2015-01-29

Applicant: HITACHI HIGH TECH SCIENCE CORP

Inventor： SAKUTA MASAHIRO

IPC: G01N23/083

Abstract: Ein Röntgenanalysator umfasst einen Probentisch, eine Röntgenstrahlquelle, die eine Probe mit primären Röntgenstrahlen bestrahlt, einen Detektor, der sekundäre Röntgenstrahlen erfasst, die von der Probe erzeugt werden, einen Positionseinstellmechanismus, der relative Positionen des Probentischs und der primären Röntgenstrahlen einstellt, einen Beobachtungsmechanismus, der ein Beobachtungsbild der Probe erhält, und einen Computer mit einer Anzeigeeinheit und einer Eingabeeinheit. Der Computer hat eine Funktion, im Ansprechen darauf, dass ein Zeiger aus einem Mittenbereich des Beobachtungsbildschirms zu einer bestimmten Position dadurch bewegt wird, dass die Eingabeeinheit gezogen wird und dabei einen Haltezustand beibehält, den Probentisch in einer Bewegungsrichtung und mit einer Bewegungsgeschwindigkeit zu bewegen, die einer Richtung und einer Distanz der bestimmten Position in Bezug auf den Mittenbereich entsprechen.

公开(公告)号：JP2014035334A

公开(公告)日：2014-02-24

申请号：JP2012178365

申请日：2012-08-10

Applicant: Hitachi High-Tech Science Corp ,  株式会社日立ハイテクサイエンス

Inventor： SAKUTA MASAHIRO ,  SAKAI NORIAKI ,  HASEGAWA KIYOSHI

IPC: G01N23/223

Abstract: PROBLEM TO BE SOLVED: To achieve efficiency of time required for analysis of a sample and automation of determination in quality control of harmful elements utilizing fluorescent X-ray analysis.SOLUTION: An X-ray analysis method is provided in which a plurality of analysis conditions and management criteria of elements to be analyzed are made to be a set of measurements, a plurality of sets of measurements consisting of a first set as simple analysis and sets after the first set as precision analysis are made possible to be set, and between sets, a determination step is provided which determines whether measurement of the next set is necessary or not. An X-ray analyzer is also provided which adopts the X-ray analysis method.

Abstract translation: 要解决的问题：利用荧光X射线分析实现样品分析所需的时间效率和有害元素质量控制的自动化。解决方案：提供一种X射线分析方法，其中多个分析条件 将要分析的要素的管理标准作为一组测量，使得可以设置由第一组作为简单分析组成的多组测量集合，并且可以设置在第一组作为精度分析之后，并且在组之间 提供了确定是否需要下一组的测量的确定步骤。 还提供采用X射线分析方法的X射线分析仪。

公开(公告)号：JP2013217915A

公开(公告)日：2013-10-24

申请号：JP2013048276

申请日：2013-03-11

Applicant: Hitachi High-Tech Science Corp ,  株式会社日立ハイテクサイエンス

Inventor： SAKUTA MASAHIRO

IPC: G01N23/223

Abstract: PROBLEM TO BE SOLVED: To provide a function of automatically detecting displacement of a sample which is likely to move during measurement, on the basis of changes of a sample image.SOLUTION: A fluorescent X-ray analyzer includes an imaging part that captures a sample image for an object to be measured, and a function of temporarily storing the sample image at the start of measurement, and comparing it with a latest sample image during or after measurement. The analyzer includes a function of warning a measurement person by a display part, buzzer sound, a signal tower, and notification to a remote management terminal if a difference is equal to or larger than a threshold as a result of image processing.

Abstract translation: 要解决的问题：提供基于样本图像的变化自动检测在测量期间可能移动的样品的位移的功能。解决方案：荧光X射线分析仪包括捕获样品的成像部件 要测量的对象的图像，以及在测量开始时临时存储样本图像的功能，并且在测量期间或之后将其与最新的样本图像进行比较。 作为图像处理的结果，如果差异等于或大于阈值，则分析器包括通过显示部分警告测量人员，蜂鸣器声音，信号塔和通知远程管理终端的功能。

公开(公告)号：JP2014185951A

公开(公告)日：2014-10-02

申请号：JP2013061311

申请日：2013-03-25

Applicant: Hitachi High-Tech Science Corp ,  株式会社日立ハイテクサイエンス

Inventor： SAKUTA MASAHIRO ,  HASEGAWA KIYOSHI ,  MATOBA YOSHITAKE

IPC: G01N23/223

CPC classification number: G01N23/223 ,  G01N2223/317 ,  G01N2223/652

Abstract: PROBLEM TO BE SOLVED: To provide an X-ray fluorescence analyzer capable of detecting a foreign substance placed on a fall prevention plate.SOLUTION: An X-ray fluorescence analyzer 1 comprises: a sample table 2 that has an opening 2a at an X-ray radiation position and where a sample S can be placed on the opening; an X-ray source 3 that radiates primary X-rays X1 to the sample placed on the opening from below; and a detector 4 that is disposed below the opening and detects fluorescent X-rays X2 generated from the sample irradiated with the primary X-rays. The X-ray fluorescence analyzer 1 further comprises: a transparent fall prevention plate 5 that is supported immediately below the opening in a manner capable of advancing and retracting; a drive mechanism 6 that advances and retracts the fall prevention plate; an observation camera 7 that is disposed below the opening so as to observe the fall prevention plate when the plate is positioned immediately below the opening; and a computing section 8 that processes an image of the fall prevention plate obtained by the observation camera. The computing section detects a foreign substance S1 on the fall prevention plate on the basis of difference between the images before and after the drive mechanism moves or vibrates the fall prevention plate within an observation range of the observation camera.

Abstract translation: 要解决的问题：提供一种能够检测放置在防坠落板上的异物的X射线荧光分析装置。解决方案：X射线荧光分析装置1包括：样品台2，其具有X轴上的开口2a， 射线辐射位置，并且样品S可以放置在开口上; X射线源3，将主X射线X1辐射到从下方置于开口上的样品; 以及检测器4，其设置在开口下方，并且检测从被照射到主X射线的样品产生的荧光X射线X2。 X射线荧光分析装置1还包括：以能够前进和后退的方式支撑在开口正下方的透明防坠落板5; 驱动机构6，其使防坠落板前进和后退; 设置在开口下方的观察照相机7，以便当板位于开口正下方时观察防坠落板; 以及处理由观察照相机获得的防坠落板的图像的计算部8。 运算部根据驱动机构移动前后的图像与观察摄像机的观察范围内的防摔板振动的差异来检测防坠落板上的异物S1。