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公开(公告)号:DE4435221A1
公开(公告)日:1996-04-04
申请号:DE4435221
申请日:1994-09-30
Applicant: HOECHST AG
Inventor: PLATZER STEPHAN J W DR , MACKERT WALTER DIPL PHYS , NEUBAUER RUDOLF DR
Abstract: Process for the mechanical roughening of the surface of an Al (alloy) printing plate carrier by wet brushing is novel in that it is wet brushed, with simultaneous application of organic fibres and metal wires placed side by side, with a suspension of 5-80 wt. % abrasive particles in water. Also claimed is a brush roller to carry out the above process having a surface covered with bands of brushes. The brush roller is novel in that the brush bands (8, 9) contain fibres and wires, the fibre material being different to the wire material.
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公开(公告)号:DE59204227D1
公开(公告)日:1995-12-14
申请号:DE59204227
申请日:1992-04-21
Applicant: HOECHST AG
Inventor: SCHMIDT HUGO DR DIPL PHYS , RUCKSZIO MANFRED , HAAS RAIMUND DR DIPL ING , MACKERT WALTER DIPL PHYS
IPC: G01B11/30
Abstract: An infrared emitter 2 whose surface temperature is kept constant during measurement is used to irradiate a measurement region 4 on a roughened material surface with heat with an oblique angle of incidence of the rays. The temperature of the reflected thermal radiation is measured by means of an infrared thermometer 3 which is arranged above the measurement region in such a way that the reflected radiation impinges in the field of view of the infrared thermometer. The overall measurement region of the material surface, which is situated in the field of view of the infrared thermometer, must be irradiated with heat. The measured temperature characteristic of the reflected radiation as a function of the known surface roughness of the material is stored in a comparator 7. This comparator 7 is fed a desired value for the desired surface roughness. The infrared temperature of a material surface which is at first unknown with regard to its surface roughness is measured and compared with the stored temperature characteristic in order to determine the magnitude of the surface roughness. The value thus obtained is used in conjunction with the desired value fed in to form a difference signal which is fed via the output 8 of the comparator 7 to a control unit 9 of a processing device for the material.
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公开(公告)号:DE4114671A1
公开(公告)日:1992-11-12
申请号:DE4114671
申请日:1991-05-06
Applicant: HOECHST AG
Inventor: SCHMIDT HUGO DIPL PHYS DR , RUCKSZIO MANFRED , HAAS RAIMUND DIPL ING DR , MACKERT WALTER DIPL PHYS
IPC: G01B11/30
Abstract: An infrared emitter 2 whose surface temperature is kept constant during measurement is used to irradiate a measurement region 4 on a roughened material surface with heat with an oblique angle of incidence of the rays. The temperature of the reflected thermal radiation is measured by means of an infrared thermometer 3 which is arranged above the measurement region in such a way that the reflected radiation impinges in the field of view of the infrared thermometer. The overall measurement region of the material surface, which is situated in the field of view of the infrared thermometer, must be irradiated with heat. The measured temperature characteristic of the reflected radiation as a function of the known surface roughness of the material is stored in a comparator 7. This comparator 7 is fed a desired value for the desired surface roughness. The infrared temperature of a material surface which is at first unknown with regard to its surface roughness is measured and compared with the stored temperature characteristic in order to determine the magnitude of the surface roughness. The value thus obtained is used in conjunction with the desired value fed in to form a difference signal which is fed via the output 8 of the comparator 7 to a control unit 9 of a processing device for the material.
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