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公开(公告)号：DE2935080A1
公开(公告)日：1981-03-19
申请号：DE2935080
申请日：1979-08-30
Applicant: HOECHST AG
Inventor： BECKER REINHOLD DR ING , KINDL ERWIN DR , RUCKSZIO MANFRED , PETRY RUDOLF DIPL ING , KINZLER ULRICH
Abstract: A flexible casing consists of a cellulose hydrate tube carring (a) an uninterrupted coating, impermeable to water vapour, of a synthetic material from polymerised aliphatic ethylenic monomers, on the inside, and (b) a permeable layer of a synthetic material from polymerised aliphatic ethylenic monomers on the outside. The sausages are not sensitive to shock, e.g. during transport. The skin does not crack when the sausages are cut.
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公开(公告)号：DE2933108A1
公开(公告)日：1981-02-26
申请号：DE2933108
申请日：1979-08-16
Applicant: HOECHST AG
Inventor： BECKER REINHOLD DR ING , KINDL ERWIN DR , RUCKSZIO MANFRED , PETRY RUDOLF DIPL ING , KINZLER ULRICH
Abstract: Flexible packing sheath consists of a cellulose hydrate base which is (a) coated externally with a continuous steam-impermeable polymer (A) layer of ethylenic gp.-contg. aliphatic polymerised monomers and (b) coated internally with a permeable polymer (B) layer of ethylenic gp.-contg. polymerised aliphatic monomers. (B) is a copolymer contg. predominantly copolymerised vinylidene chloride and a lesser quantity of at least 2 different copolymerised co-monomers, each contg. an ethylenically unsaturated gp. in mol., at least one being acrylonitrile. (A) is a copolymer contg. at least 3 different aliphatic co-monomers, each contg. an ethylenically unsatd. gp. in mol. Pref. (A) contains predominantly vinylidene chloride and minor quantities of at least 2 aliphatic monomers each contg. ethylenically unsatd. gps., e.g. (meth)acrylic acid, itaconic acid, (meth)acrylate ester and/or acrylonitrile. Flexible sheath use as a synthetic sausage skin is claimed, esp. for boiling and broiling sausage. Internal fat and gel deposition is prevented. Before filling, the sheath can be brought to optimum water-content, for further working.
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公开(公告)号：ES2080980T3
公开(公告)日：1996-02-16
申请号：ES92106786
申请日：1992-04-21
Applicant: HOECHST AG
Inventor： SCHMIDT HUGO DR DIPL-PHYS , RUCKSZIO MANFRED , HAAS RAIMUND DR DIPL-ING , MACKERT WALTER DIPL-PHYS
IPC: G01B11/30
Abstract: An infrared emitter 2 whose surface temperature is kept constant during measurement is used to irradiate a measurement region 4 on a roughened material surface with heat with an oblique angle of incidence of the rays. The temperature of the reflected thermal radiation is measured by means of an infrared thermometer 3 which is arranged above the measurement region in such a way that the reflected radiation impinges in the field of view of the infrared thermometer. The overall measurement region of the material surface, which is situated in the field of view of the infrared thermometer, must be irradiated with heat. The measured temperature characteristic of the reflected radiation as a function of the known surface roughness of the material is stored in a comparator 7. This comparator 7 is fed a desired value for the desired surface roughness. The infrared temperature of a material surface which is at first unknown with regard to its surface roughness is measured and compared with the stored temperature characteristic in order to determine the magnitude of the surface roughness. The value thus obtained is used in conjunction with the desired value fed in to form a difference signal which is fed via the output 8 of the comparator 7 to a control unit 9 of a processing device for the material.
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公开(公告)号：CA2067999A1
公开(公告)日：1992-11-07
申请号：CA2067999
申请日：1992-05-05
Applicant: HOECHST AG
Inventor： SCHMIDT HUGO , RUCKSZIO MANFRED , HAAS RAIMUND
Abstract: With an infrared radiator, the surface temperature of which is kept constant during measurement, a measuring area on a material surface is thermally irradiated with oblique incidence of the rays. The temperature of the reflected thermal radiation is measured by an infrared thermometer, which is arranged above the measuring area in such a way that the reflected radiation falls into the area of coverage of the infrared thermometer. The entire measuring area of the material surface which lies in the field of coverage of the infrared thermometer must be thermally irradiated. The measured temperature variation of the reflected radiation in dependence on the surface condition of the material is stored in a comparison device. A set value for the desired surface condition is fed to this comparison device. The infrared temperature of a material surface, initially unknown with respect to its surface condition, is measured and compared with the stored temperature variation in order to determine the magnitude of the surface parameter. From the value thus obtained and the set value fed in, a differential signal is formed, which is fed via the output of the comparison device to a control of a treatment device for the material. A:\\APP¦4/7/92¦ALEX839¦TEN:lynn/ags
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公开(公告)号：ES2080981T3
公开(公告)日：1996-02-16
申请号：ES92106787
申请日：1992-04-21
Applicant: HOECHST AG
Abstract: An infrared emitter 2 whose surface temperature is held constant during measurement is used to irradiate a measurement region 4 on a material surface with heat with an oblique angle of incidence of the rays. The temperature of the reflected thermal radiation is measured by means of an infrared thermometer 3 which is arranged above the measurement region in such a way that the reflected radiation impinges in the field of view of the infrared thermometer. The overall measurement region of the material surface, which is situated in the field of view of the infrared thermometer, must be irradiated with heat. The measured temperature characteristic of the reflected radiation as a function of the known nature of the surface of the material is stored in a comparator 7. This comparator 7 is fed a desired value for the desired nature of the surface. The infrared temperature of a material surface which is at first unknown with regard to its surface nature is measured and compared with the stored temperature characteristic in order to determine the magnitude of the surface parameter. The value thus obtained is used in conjunction with the desired value fed in to form a difference signal which is fed via the output 8 of the comparator 7 to a control unit 9 of a processing device for the material.
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Patent Agency Ranking
公开(公告)号：BR9201682A
公开(公告)日：1992-12-15
申请号：BR9201682
申请日：1992-05-05
Applicant: HOECHST AG
Inventor： SCHMIDT HUGO , RUCKSZIO MANFRED , HAAS RAIMUND
Abstract: An infrared emitter 2 whose surface temperature is held constant during measurement is used to irradiate a measurement region 4 on a material surface with heat with an oblique angle of incidence of the rays. The temperature of the reflected thermal radiation is measured by means of an infrared thermometer 3 which is arranged above the measurement region in such a way that the reflected radiation impinges in the field of view of the infrared thermometer. The overall measurement region of the material surface, which is situated in the field of view of the infrared thermometer, must be irradiated with heat. The measured temperature characteristic of the reflected radiation as a function of the known nature of the surface of the material is stored in a comparator 7. This comparator 7 is fed a desired value for the desired nature of the surface. The infrared temperature of a material surface which is at first unknown with regard to its surface nature is measured and compared with the stored temperature characteristic in order to determine the magnitude of the surface parameter. The value thus obtained is used in conjunction with the desired value fed in to form a difference signal which is fed via the output 8 of the comparator 7 to a control unit 9 of a processing device for the material.
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公开(公告)号：DE59204228D1
公开(公告)日：1995-12-14
申请号：DE59204228
申请日：1992-04-21
Applicant: HOECHST AG
Abstract: An infrared emitter 2 whose surface temperature is held constant during measurement is used to irradiate a measurement region 4 on a material surface with heat with an oblique angle of incidence of the rays. The temperature of the reflected thermal radiation is measured by means of an infrared thermometer 3 which is arranged above the measurement region in such a way that the reflected radiation impinges in the field of view of the infrared thermometer. The overall measurement region of the material surface, which is situated in the field of view of the infrared thermometer, must be irradiated with heat. The measured temperature characteristic of the reflected radiation as a function of the known nature of the surface of the material is stored in a comparator 7. This comparator 7 is fed a desired value for the desired nature of the surface. The infrared temperature of a material surface which is at first unknown with regard to its surface nature is measured and compared with the stored temperature characteristic in order to determine the magnitude of the surface parameter. The value thus obtained is used in conjunction with the desired value fed in to form a difference signal which is fed via the output 8 of the comparator 7 to a control unit 9 of a processing device for the material.
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公开(公告)号：DE59204227D1
公开(公告)日：1995-12-14
申请号：DE59204227
申请日：1992-04-21
Applicant: HOECHST AG
Inventor： SCHMIDT HUGO DR DIPL PHYS , RUCKSZIO MANFRED , HAAS RAIMUND DR DIPL ING , MACKERT WALTER DIPL PHYS
IPC: G01B11/30
Abstract: An infrared emitter 2 whose surface temperature is kept constant during measurement is used to irradiate a measurement region 4 on a roughened material surface with heat with an oblique angle of incidence of the rays. The temperature of the reflected thermal radiation is measured by means of an infrared thermometer 3 which is arranged above the measurement region in such a way that the reflected radiation impinges in the field of view of the infrared thermometer. The overall measurement region of the material surface, which is situated in the field of view of the infrared thermometer, must be irradiated with heat. The measured temperature characteristic of the reflected radiation as a function of the known surface roughness of the material is stored in a comparator 7. This comparator 7 is fed a desired value for the desired surface roughness. The infrared temperature of a material surface which is at first unknown with regard to its surface roughness is measured and compared with the stored temperature characteristic in order to determine the magnitude of the surface roughness. The value thus obtained is used in conjunction with the desired value fed in to form a difference signal which is fed via the output 8 of the comparator 7 to a control unit 9 of a processing device for the material.
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公开(公告)号：CA2068000A1
公开(公告)日：1992-11-07
申请号：CA2068000
申请日：1992-05-05
Applicant: HOECHST AG
Inventor： SCHMIDT HUGO , RUCKSZIO MANFRED , HAAS RAIMUND , MACKERT WALTER
Abstract: With an infrared radiator, the surface temperature of which is kept constant during measurement, a measuring area on a roughened material surface is thermally irradiated with oblique incidence of the rays. The temperature of the reflected thermal radiation is measured by an infrared thermometer, which is arranged above the measuring area in such a way that the reflected radiation falls into the area of coverage of the infrared thermometer. The entire measuring area of the material surface which lies in the field of coverage of the infrared thermometer must be thermally irradiated. The measured temperature variation of the reflected radiation in dependence on the known surface roughness of the material is stored in a comparison device. This comparison device is fed a set value for the desired surface roughness. The infrared temperature of a material surface, initially unknown with respect to its surface roughness, is measured and compared with the stored temperature variation, in order to determine the magnitude of the surface roughness. From the value thus obtained and the set value fed in, a differential signal is formed, which is fed via the output of the comparison device to a control of a treatment device for the material. A:\\APP¦4/7/92¦ALEX839¦TEN:jw/ags
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公开(公告)号：BR9201678A
公开(公告)日：1992-12-15
申请号：BR9201678
申请日：1992-05-05
Applicant: HOECHST AG
Inventor： SCHMIDT HUGO , RUCKSZIO MANFRED , HAAS RAIMUND , MACKERT WALTER
IPC: G01B11/30
Abstract: An infrared emitter 2 whose surface temperature is kept constant during measurement is used to irradiate a measurement region 4 on a roughened material surface with heat with an oblique angle of incidence of the rays. The temperature of the reflected thermal radiation is measured by means of an infrared thermometer 3 which is arranged above the measurement region in such a way that the reflected radiation impinges in the field of view of the infrared thermometer. The overall measurement region of the material surface, which is situated in the field of view of the infrared thermometer, must be irradiated with heat. The measured temperature characteristic of the reflected radiation as a function of the known surface roughness of the material is stored in a comparator 7. This comparator 7 is fed a desired value for the desired surface roughness. The infrared temperature of a material surface which is at first unknown with regard to its surface roughness is measured and compared with the stored temperature characteristic in order to determine the magnitude of the surface roughness. The value thus obtained is used in conjunction with the desired value fed in to form a difference signal which is fed via the output 8 of the comparator 7 to a control unit 9 of a processing device for the material.
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