Sample carrier
    1.
    发明专利
    Sample carrier 有权
    样品载体

    公开(公告)号:JP2010060558A

    公开(公告)日:2010-03-18

    申请号:JP2009188953

    申请日:2009-08-18

    Abstract: PROBLEM TO BE SOLVED: To provide a sample carrier (sample holder) of closeness with a simple structure and assembly for biologically active sample, in particular for toxic samples and especially for severe toxic samples. SOLUTION: The sample carrier 1 includes a bottom part 10, a first membrane 12, a spacer 13, a second membrane 14 and a lid 16. The bottom part 10 and the lid concerned 16 are connectable in such a way, that the first membrane 12, the spacer 13, and the second membrane 14 are enclosed between the bottom part 10 and the lid 16. The bottom part 10 and the lid 16 include a means for a non-detachable form-locking connection of the bottom part 10 and the lid 16. COPYRIGHT: (C)2010,JPO&INPIT

    Abstract translation: 要解决的问题:提供具有生物活性样品的简单结构和组装的亲和性样品载体(样品保持器),特别是对于有毒样品,特别是对于严重有毒样品。 解决方案:样品载体1包括底部10,第一膜12,间隔物13,第二膜14和盖16.底部10和盖16可以这样的方式连接,即 第一膜12,间隔件13和第二膜14被封装在底部部分10和盖子16之间。底部部分10和盖子16包括用于底部部分10和盖子16的不可拆卸的形状锁定连接的装置 10和盖16。版权所有(C)2010,JPO&INPIT

    Method and device for x-ray diffraction analysis
    2.
    发明专利
    Method and device for x-ray diffraction analysis 审中-公开
    用于X射线衍射分析的方法和装置

    公开(公告)号:JP2006313157A

    公开(公告)日:2006-11-16

    申请号:JP2006127172

    申请日:2006-05-01

    CPC classification number: G01N23/20

    Abstract: PROBLEM TO BE SOLVED: To provide a method and device for X-ray transmission diffraction analysis remarkably improved in particle statistics.
    SOLUTION: This method includes: a step for disposing a sample on a substrate; a step for generating a band-shaped X-ray beam with its center portion extending along a plane by an X-ray radiation source; a step for disposing the substrate and sample at initial positions where the sample stands in the route of the beam and a thin-leaf part of the sample is irradiated with the beam; a step for executing the following motions of the substrate with respect to the initial position of the substrate, that is, rotations around a rotation axis line vertical to the substrate being the rotations of the substrate and sample through a prescribed rotation angle, and tilting motions of the substrate and sample through an inclination angle defined as an angle between a plane with the center portion of the beam around a tilt axis line extending therein and the rotation axis line being tilting motions through the tilt angle changing between first and second prescribed values; and a step for detecting X-ray radiations transmitted and diffracted by the sample during a period between times at which the motions of the substrate are executed.
    COPYRIGHT: (C)2007,JPO&INPIT

    Abstract translation: 要解决的问题:提供一种在粒子统计中显着提高的X射线衍射分析方法和装置。 解决方案:该方法包括:将样品设置在基板上的步骤; 用于产生带状X射线束的步骤,其中心部分通过X射线辐射源沿着平面延伸; 将基板和样品设置在样品在梁的路径中的原始位置并且样品的薄叶部分用光束照射的步骤; 相对于基板的初始位置执行基板的以下运动的步骤,即,与基板垂直的旋转轴线周围的旋转是基板和样品的旋转,并且具有规定的旋转角度,以及倾斜运动 所述倾斜角定义为与围绕其延伸的倾斜轴线的光束的中心部分的平面之间的角度,并且所述旋转轴线是通过在第一和第二规定值之间变化的倾斜角度的倾斜运动; 以及用于在执行基板的运动的时间段期间检测由样品透射和衍射的X射线辐射的步骤。 版权所有(C)2007,JPO&INPIT

Patent Agency Ranking