SENSOR SYSTEM AND METHODS USED TO DETECT MATERIAL WEAR AND SURFACE DETERIORATION
    1.
    发明申请
    SENSOR SYSTEM AND METHODS USED TO DETECT MATERIAL WEAR AND SURFACE DETERIORATION 审中-公开
    传感器系统和方法用于检测材料磨损和表面缺陷

    公开(公告)号:WO2004024979B1

    公开(公告)日:2004-05-27

    申请号:PCT/US0328832

    申请日:2003-09-12

    CPC classification number: H01J37/3479 C23C14/3407

    Abstract: A sensor system has been developed for measuring erosion of a sputtering target (510) in a vacuum chamber that includes: a) a sputtering target, b) a wafer, c) a vacuum atmosphere located between the sputtering target and the wafer, and d) a sensor device (525) directly coupled to the sputtering target (510), wherein the sensor device (525) is exposed to the vacuum atmosphere and comprises a data collection apparatus that is exposed to atmospheric pressure. A method of detecting erosion in a sputtering target (510) has also been developed that includes: a) providing a sputtering target (510), b) providing a wafer (550), c) initiating a vacuum atmosphere and a plasma that are located between the sputtering target (510) and the wafer (550), d) providing a sensor device (525) directly coupled to the sputtering target (510), wherein the sensor device (525) is partly exposed to the vacuum atmosphere and comprises a data collection apparatus that is exposed to atmospheric pressure, e) collecting data from the data collection apparatus; and f) automatically terminating the operation of the plasma once the data collection apparatus determines that the sputtering target (510) has sufficiently eroded.

    Abstract translation: 已经开发了用于测量真空室中的溅射靶(510)的侵蚀的传感器系统,所述真空室包括:a)溅射靶,b)晶片,c)位于溅射靶和晶片之间的真空气氛,以及d )直接耦合到溅射靶(510)的传感器装置(525),其中传感器装置(525)暴露于真空气氛并且包括暴露于大气压的数据收集装置。 还已经开发了检测溅射靶(510)中的侵蚀的方法,该方法包括:a)提供溅射靶(510),b)提供晶片(550),c)引发位于其中的真空气氛和等离子体 在所述溅射靶(510)和所述晶片(550)之间,d)提供直接耦合到所述溅射靶(510)的传感器装置(525),其中所述传感器装置(525)部分地暴露于所述真空气氛并且包括 数据收集装置,其暴露于大气压力,e)从数据收集装置收集数据; 以及f)一旦数据采集装置确定溅射靶(510)已经充分侵蚀,则自动终止等离子体的操作。

    SENSOR SYSTEM AND METHODS USED TO DETECT MATERIAL WEAR AND SURFACE DETERIORATION
    2.
    发明申请
    SENSOR SYSTEM AND METHODS USED TO DETECT MATERIAL WEAR AND SURFACE DETERIORATION 审中-公开
    传感器系统和用于检测材料磨损和表面检测的方法

    公开(公告)号:WO2004024979A9

    公开(公告)日:2004-07-15

    申请号:PCT/US0328832

    申请日:2003-09-12

    CPC classification number: H01J37/3479 C23C14/3407

    Abstract: A sensor system has been developed for measuring erosion of a sputtering target (510) in a vacuum chamber that includes: a) a sputtering target, b) a wafer, c) a vacuum atmosphere located between the sputtering target and the wafer, and d) a sensor device (525) directly coupled to the sputtering target (510), wherein the sensor device (525) is exposed to the vacuum atmosphere and comprises a data collection apparatus that is exposed to atmospheric pressure. A method of detecting erosion in a sputtering target (510) has also been developed that includes: a) providing a sputtering target (510), b) providing a wafer (550), c) initiating a vacuum atmosphere and a plasma that are located between the sputtering target (510) and the wafer (550), d) providing a sensor device (525) directly coupled to the sputtering target (510), wherein the sensor device (525) is partly exposed to the vacuum atmosphere and comprises a data collection apparatus that is exposed to atmospheric pressure, e) collecting data from the data collection apparatus; and f) automatically terminating the operation of the plasma once the data collection apparatus determines that the sputtering target (510) has sufficiently eroded.

    Abstract translation: 已经开发了用于测量真空室中的溅射靶(510)的侵蚀的传感器系统,其包括:a)溅射靶,b)晶片,c)位于溅射靶和晶片之间的真空气氛,d )直接耦合到所述溅射靶(510)的传感器装置(525),其中所述传感器装置(525)暴露于所述真空气氛,并且包括暴露于大气压的数据采集装置。 还开发了一种检测溅射靶(510)中的侵蚀的方法,包括:a)提供溅射靶(510),b)提供晶片(550),c)启动位于 在所述溅射靶(510)和所述晶片(550)之间,d)提供直接耦合到所述溅射靶(510)的传感器装置(525),其中所述传感器装置(525)部分地暴露于所述真空气氛并且包括 暴露于大气压的数据收集装置,e)从数据收集装置收集数据; 以及f)一旦数据收集装置确定溅射靶(510)已被充分侵蚀,则自动终止等离子体的操作。

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