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1.发明申请MAGNETIC RECORDING MEDIUM UNDERLAYER AND METHOD FOR OBTAINING A DESIRED LATTICE PARAMETER THEREFOR 审中-公开磁记录介质内层和获得其所需尺寸参数的方法
公开(公告)号：WO0124171A9
公开(公告)日：2002-09-26
申请号：PCT/US0026851
申请日：2000-09-29
Applicant: HYUNDAI ELECTRONICS AMERICA
Inventor： WONG BUNSEN Y
CPC classification number: G11B5/7325 , G11B5/8404
Abstract: An underlayer (8A) of a magnetic recording medium (16) includes first and second non-magnetic, chromium-based layers (18, 20), at least one of the first and second chromium-based layers being a chromium alloy. The lattice parameter of the composite underlayer is between the lattice parameters of the first and second chromium-based layers. Recognizing this permits one to predictably adjust the lattice parameter of the composite underlayer to be close to the lattice parameter of the magnetic layer (10) so to optimize magnetic and parametric properties.
Abstract translation: 磁记录介质（16）的底层（8A）包括第一和第二非磁性铬基层（18,20），第一和第二铬基层中的至少一个是铬合金。 复合底层的晶格参数在第一和第二铬基层的晶格参数之间。 认识到这允许可预测地将复合底层的晶格参数调整为接近磁性层（10）的晶格参数，从而优化磁性和参数特性。
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2.发明专利
公开(公告)号：AU7839800A
公开(公告)日：2001-04-30
申请号：AU7839800
申请日：2000-09-29
Applicant: HYUNDAI ELECTRONICS AMERICA
Inventor： WONG BUNSEN Y
Abstract: An underlayer (8A) of a magnetic recording medium (16) includes first and second non-magnetic, chromium-based layers (18, 20), at least one of the first and second chromium-based layers being a chromium alloy. The lattice parameter of the composite underlayer is between the lattice parameters of the first and second chromium-based layers. Recognizing this permits one to predictably adjust the lattice parameter of the composite underlayer to be close to the lattice parameter of the magnetic layer (10) so to optimize magnetic and parametric properties.
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