PROBE ASSEMBLY STRUCTURE
    1.
    发明专利

    公开(公告)号:JP2003098190A

    公开(公告)日:2003-04-03

    申请号:JP2002198077

    申请日:2002-07-08

    Applicant: IBM

    Abstract: PROBLEM TO BE SOLVED: To provide a probe capable of forming an electric contact capable of self-alignment for the use of thousands times by combining the material characteristic and the shape characteristic of an electric probe contact. SOLUTION: The probe contact moves only nearly vertical direction and gives a continuous contact force to a corresponding electric contact pad on a semiconductor wafer. The probe contact is constituted in an array of a multitude of individual contacts extending from a base, and the individual contacts are attached to the base passing through the openings of a mask above apart from the base.

    RETAINING MECHANISM AGAINST EARTHQUAKE OR DEVICE FOR AVOIDING DAMAGE

    公开(公告)号:JP2000104394A

    公开(公告)日:2000-04-11

    申请号:JP20112499

    申请日:1999-07-15

    Applicant: IBM

    Abstract: PROBLEM TO BE SOLVED: To provide an economical device easily assembled, which prevents an expensive computer frame from being damaged and has many energy- absorbing points assisting to retain the peak level even when the operating computer is under a heavy earthquake activity. SOLUTION: A fastening mechanism where screwing yokes are arranged at opposite ends is used as a means to provide a retaining device 10 fixing a relatively heavy computer and/or other instruments during an earthquake, together with eyebolts arranged in respective yoke parts of the screwing yoke. Elecrtric instruments are fitted into a frame 100 having a plurality of metallic plates 20 fixed to the bottom. The frame 100 is provided with casters 110 and hence, these instruments can be easily carried to a specified position by the casters 110 and then, firmly fixed at the specified position by using a small number of pins inserted in the screwing yokes and the eyebolts.

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