公开(公告)号：DE1901815A1

公开(公告)日：1970-08-27

申请号：DE1901815

申请日：1969-01-15

Applicant: IBM

Inventor： DUDLEY BERNARD JOHN ,  ROBERT GIEDD GARY ,  FALLS WAPPINGERS ,  CARMEN GAITO CARL ,  HAROLD PERKINS MERLYN ,  JUNCTION HOPEWELL ,  GRANGER GREENE THOMAS ,  WILLIAM LIND JAMES ,  MARK PROSS CHARLES

IPC: G01R31/317 ,  G01R31/319 ,  G01R31/3193 ,  G01R31/00

Abstract: A test system is provided for performing functional tests on combinatorial and sequential monolithic devices with the testing automatically programmed under control of a computer processing unit. The test results can be printed out on a printer, logged on tape and/or punched on cards.