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公开(公告)号:DE1912463A1
公开(公告)日:1969-11-06
申请号:DE1912463
申请日:1969-03-12
Applicant: IBM
Inventor: ROBERT GIEDD GARY , HAROLD PERKINS MERLYN
Abstract: 1,261,108. Controlling continuous furnaces. INTERNATIONAL BUSINESS MACHINES CORP. 14 March, 1969 [15 March, 1968], No. 13455/69. Heading F4B. [Also in Divisions B6, G2-G3 and H1] An automated apparatus, Fig. 1, for fabricating multi-layer ceramic modules is controlled by a process computer 2 through an output line 20. Wire mesh masks are coated with a photo-sensitized epoxy material in a screen preparation unit 16 and fed to a printed circuit exposure inspection tool 14 wherein the coated screen is exposed in a pattern determined by the computer. The exposed screen is then inspected and fed to a developing unit 18 after which it is inspected in tool 14 and passed to a printing unit 8. The developed screen is positioned on a ceramic green sheet, from a punch unit 6, and a conductive printed pattern deposited by a silk-screen printing process. After a further inspection in the tool 14 the modules are stacked in a unit 10 and fired in a heating unit 12 from which they are delivered as multi-layer ceramic modules. Heating unit, Fig. 8. A plurality of stacked modules are transferred, by belts 148, (1) through an entrance gate 152 into a first oven zone 153 which is preconditioned by heating coils 154 to provide a desired temperature profile, (2) through a gate 155 to a constant temperature firing zone 15, (3) through a gate 157 to a cooling zone 158 and finally exited at a gate 160. The heating coils 154 of the zones are controlled in response to thermocouples 159 and the operating conditions monitored by the computer.
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公开(公告)号:DE1901815A1
公开(公告)日:1970-08-27
申请号:DE1901815
申请日:1969-01-15
Applicant: IBM
Inventor: DUDLEY BERNARD JOHN , ROBERT GIEDD GARY , FALLS WAPPINGERS , CARMEN GAITO CARL , HAROLD PERKINS MERLYN , JUNCTION HOPEWELL , GRANGER GREENE THOMAS , WILLIAM LIND JAMES , MARK PROSS CHARLES
IPC: G01R31/317 , G01R31/319 , G01R31/3193 , G01R31/00
Abstract: A test system is provided for performing functional tests on combinatorial and sequential monolithic devices with the testing automatically programmed under control of a computer processing unit. The test results can be printed out on a printer, logged on tape and/or punched on cards.
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