MULTIPLE DIELECTRIC FINFET STRUCTURE AND METHOD
    2.
    发明申请
    MULTIPLE DIELECTRIC FINFET STRUCTURE AND METHOD 审中-公开
    多电介质FinFET结构与方法

    公开(公告)号:WO2005089440A3

    公开(公告)日:2009-04-02

    申请号:PCT/US2005008940

    申请日:2005-03-18

    Abstract: Disclosed is a method and structure for a fin-type field effect transistor (FinFET) structure that has different thickness gate dielectrics (502, 504) covering the fins (112, 113, 114) extending from the substrate (110). These fins have a central channel region and source (60) and drain (62) regions on opposite sides of the channel region. The thicker gate dielectrics (504) can comprise multiple layers of dielectric (200, 500) and the thinner gate dielectrics (502) can comprise less layers of dielectric (200). A cap (116) comprising a different material than the gate dielectrics can be positioned over the fins.

    Abstract translation: 公开了一种鳍式场效应晶体管(FinFET)结构的方法和结构,其具有覆盖从衬底(110)延伸的翅片(112,113,114)的不同厚度的栅极电介质(502,504)。 这些翅片在通道区域的相对侧上具有中心通道区域和源极(60)和漏极(62)区域。 较厚的栅极电介质(504)可以包括多层电介质(200,500),并且较薄的栅极电介质(502)可以包括更少的电介质层(200)。 包括与栅极电介质不同的材料的帽(116)可以位于鳍上。

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