1.
    发明专利
    未知

    公开(公告)号:DE2412265A1

    公开(公告)日:1974-09-26

    申请号:DE2412265

    申请日:1974-03-14

    Applicant: IBM

    Abstract: A method and apparatus for determining the characteristics of a luminescent material using a monochromator to detect the intensity of a light emitted by the material at a single major spectral line as the material is scanned. The wavelength of a monochromator is adjusted such that the intensity being measured is the peak intensity. The fact that the intensity is the peak intensity is determined by taking the derivative of the intensity with respect to wavelength as the wavelength of the monochromator is modulated by a wavelength wobbler. The intensity is at its peak when the derivative equals zero. The derivative signal is applied to a servo loop which controls the wavelength of the monochromator and varies the wavelength such that the derivative is maintained equal to zero. This technique may be used to determine the atomic proportions of material having intensity and/or wavelength related to its composition, to define areas of a material having particular characteristics, to evaluate a piece of material, or to determine the line shape of the spectral curve at a point on the material.

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