Abstract:
PROBLEM TO BE SOLVED: To provide a method to design a mask for integrated circuit (IC) design layout drawing in order to efficiently configure sub-resolution assist features (SRAFs) corresponding to an optimally structured annular illumination light source of a lithography projection system. SOLUTION: A critical pitch relative to an IC design is specified, and the optimal inner radial coordinate σ inner and the optimal outer radial coordinate σ outer of an annular illumination light source are determined so that an image projected through a mask is optimized throughout the pitch range in a design layout. A relation is given to determine the optimal inner radius and the optimal outer radius for the annular illumination light source. The number and positions of sub-resolution assist features (SRAFs) is added to the mask design so that the obtained pitch range almost corresponds to the critical pitch. This method to configure SRAFs so that an image has optimal characteristics such as a good contrast and a good focal depth takes a short time. COPYRIGHT: (C)2004,JPO&NCIPI