公开(公告)号：DE60307523D1

公开(公告)日：2006-09-21

申请号：DE60307523

申请日：2003-10-17

Applicant: IBM DEUTSCHLAND ,  IBM

Inventor： GRIMM HUBERT

IPC: G01R33/18

Abstract: A system for use when measuring a magnetostriction value of a magnetoresistive element according to one embodiment includes a mechanism for applying a first magnetic field about parallel to a substrate having one or more magnetoresistive elements, and for applying a second magnetic field about perpendicular to the substrate and about parallel to magnetoresistive layers of the elements; and a mechanism for applying a mechanical stress to the substrate during application of the magnetic fields.

公开(公告)号：DE60307523T2

公开(公告)日：2007-10-11

申请号：DE60307523

申请日：2003-10-17

Applicant: IBM

Inventor： GRIMM HUBERT

IPC: G01R33/18

Abstract: A system for use when measuring a magnetostriction value of a magnetoresistive element according to one embodiment includes a mechanism for applying a first magnetic field about parallel to a substrate having one or more magnetoresistive elements, and for applying a second magnetic field about perpendicular to the substrate and about parallel to magnetoresistive layers of the elements; and a mechanism for applying a mechanical stress to the substrate during application of the magnetic fields.

公开(公告)号：AT336009T

公开(公告)日：2006-09-15

申请号：AT03769408

申请日：2003-10-17

Applicant: IBM

Inventor： GRIMM HUBERT

IPC: G01R33/18

Abstract: A system for use when measuring a magnetostriction value of a magnetoresistive element according to one embodiment includes a mechanism for applying a first magnetic field about parallel to a substrate having one or more magnetoresistive elements, and for applying a second magnetic field about perpendicular to the substrate and about parallel to magnetoresistive layers of the elements; and a mechanism for applying a mechanical stress to the substrate during application of the magnetic fields.

公开(公告)号：DE102004060249A1

公开(公告)日：2005-07-28

申请号：DE102004060249

申请日：2004-12-15

Applicant: IBM

Inventor： GRIMM HUBERT ,  PAUL JOHANNES ,  SCHAEFER ROLF

IPC: G01B7/14 ,  G01B7/30 ,  G01R33/09

Abstract: The sensor has a soft-magnetic planar structure with two flux guides separated by two non-parallel elongated gaps. Two magnetoresistive detectors (102,104) are positioned along the gaps and electrically connected to an electrical source and an electrical measurement unit. Each detector provides an electrical signal indicating relative angle between the direction of the magnetic field and the orientation of the detectors. An independent claim is also included for a signal processing system.

公开(公告)号：AU2003278097A1

公开(公告)日：2004-07-14

申请号：AU2003278097

申请日：2003-10-17

Applicant: IBM

Inventor： GRIMM HUBERT

IPC: G01R33/18

Abstract: A system for use when measuring a magnetostriction value of a magnetoresistive element according to one embodiment includes a mechanism for applying a first magnetic field about parallel to a substrate having one or more magnetoresistive elements, and for applying a second magnetic field about perpendicular to the substrate and about parallel to magnetoresistive layers of the elements; and a mechanism for applying a mechanical stress to the substrate during application of the magnetic fields.