公开(公告)号：US3498452A

公开(公告)日：1970-03-03

申请号：US3498452D

申请日：1968-05-16

Applicant: IBM

Inventor： ARONSTEIN JESSE ,  GUNTHERT RICHARD JOHN ,  TROLLMANN CONRAD

IPC: B07C5/06

CPC classification number: B07C5/065 ,  Y10S209/905 ,  Y10S209/919

公开(公告)号：GB1275948A

公开(公告)日：1972-06-01

申请号：GB4287669

申请日：1969-08-28

Applicant: IBM

Inventor： GUNTHERT RICHARD JOHN

IPC: G01R1/067 ,  G01R1/073 ,  H01H1/32

Abstract: 1275948 Probes INTERNATIONAL BUSINESS MACHINES CORP 28 Aug 1969 [28 Aug 1968] 42876/69 Heading H2E A probe 305 for making simultaneous current and potential connections to a ball-shaped electrical terminal 307 has a pair of contacts 301, 302 separated by an insulating layer 303 which is cut short at the probe tip to expose inwardly-facing, bevelled contact surfaces 311, 312. The surfaces form a trough which makes contact at two points on the ball 307 of solder on the surface of a semi-conductor device 308 which is held rigidly on a support 309. A formula is given for the maximum angle of the trough to ensure self-alignment of the probe. The surfaces 311, 312 may alternatively be curved, e.g. parabolic. A probe may be held in a device (401-403, Fig. 2, not shown) which permits freedom of movement of the probe in two directions parallel to a support 309.