公开(公告)号：US3628144A

公开(公告)日：1971-12-14

申请号：US3628144D

申请日：1969-01-15

Applicant: IBM

Inventor： ARONSTEIN JESSE ,  GUNTHERT RICHARD J

IPC: B24B53/00 ,  G01B5/06 ,  G01B11/06 ,  G01R1/067 ,  G01R1/073 ,  H01H1/60 ,  H01L21/50 ,  H01L21/66 ,  G01R31/00 ,  B24B19/00 ,  H01H9/00

CPC classification number: G01B5/066 ,  G01B11/0683 ,  G01R1/06705 ,  G01R1/07342

Abstract: Electric contacts, which are utilized in testing semiconductor chips or the like, become contaminated by deposits left on the contacts by the chips during testing. These contaminants are removed by cleaning means movable by the chip handling equipment. After the contacts have been cleaned, the debris is removed by an air jet.

公开(公告)号：US3498452A

公开(公告)日：1970-03-03

申请号：US3498452D

申请日：1968-05-16

Applicant: IBM

Inventor： ARONSTEIN JESSE ,  GUNTHERT RICHARD JOHN ,  TROLLMANN CONRAD

IPC: B07C5/06

CPC classification number: B07C5/065 ,  Y10S209/905 ,  Y10S209/919

公开(公告)号：US3427517A

公开(公告)日：1969-02-11

申请号：US3427517D

申请日：1966-05-19

Applicant: IBM

Inventor： ARONSTEIN JESSE ,  CACCOMA GEORGE A

IPC: H01L21/68 ,  H01G13/00 ,  H01H49/00 ,  H02B3/00

CPC classification number: H01L21/68

公开(公告)号：US3480836A

公开(公告)日：1969-11-25

申请号：US3480836D

申请日：1966-08-11

Applicant: IBM

Inventor： ARONSTEIN JESSE

IPC: H01L21/60 ,  H01L23/538 ,  H05K1/18 ,  H05K3/28 ,  H05K3/40 ,  H05K7/20 ,  H05K1/10

CPC classification number: H01L24/50 ,  H01L23/538 ,  H01L2924/01004 ,  H01L2924/01006 ,  H01L2924/0101 ,  H01L2924/01012 ,  H01L2924/01013 ,  H01L2924/01015 ,  H01L2924/01019 ,  H01L2924/01023 ,  H01L2924/01027 ,  H01L2924/01029 ,  H01L2924/01032 ,  H01L2924/01033 ,  H01L2924/01047 ,  H01L2924/01056 ,  H01L2924/01057 ,  H01L2924/0106 ,  H01L2924/01063 ,  H01L2924/01068 ,  H01L2924/01074 ,  H01L2924/01077 ,  H01L2924/01078 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/01088 ,  H01L2924/19041 ,  H01L2924/19043 ,  H01L2924/351 ,  H05K1/184 ,  H05K3/284 ,  H05K3/4092 ,  H05K2201/0397 ,  H05K2201/10166 ,  H05K2201/10636 ,  Y02P70/611 ,  Y10T29/49144 ,  H01L2924/00

公开(公告)号：US3889355A

公开(公告)日：1975-06-17

申请号：US32992073

申请日：1973-02-05

Applicant: IBM

Inventor： ARONSTEIN JESSE ,  HARDING WILLIAM E

IPC: H01L21/30 ,  B23Q41/06 ,  H01L21/02 ,  H01L21/027 ,  H01L21/50 ,  H01L21/677 ,  H01L21/70 ,  B01J17/00

CPC classification number: B23Q41/06 ,  Y10T29/41 ,  Y10T29/5124

Abstract: A manufacturing system utilizing a plurality of satellite functional processing stations or sectors, each capable of standalone operation. The stations are interconnected by a handler or conveyor, which will transport individual ones of work-pieces from one processing station to the next in accordance with a prescribed sequence corresponding to the processing requirements for the workpiece.

公开(公告)号：US3426883A

公开(公告)日：1969-02-11

申请号：US3426883D

申请日：1967-07-28

Applicant: IBM

Inventor： ARONSTEIN JESSE ,  MOZER DONALD T ,  POLONCIC STANLEY J

IPC: H01L21/677 ,  H01L21/68 ,  H05K13/02 ,  B65G47/24

CPC classification number: H05K13/022 ,  H01L21/67793 ,  H01L21/68

公开(公告)号：DE2001534A1

公开(公告)日：1970-11-19

申请号：DE2001534

申请日：1970-01-14

Applicant: IBM

Inventor： ARONSTEIN JESSE ,  JOHN GUNTHERT RICHARD

IPC: B24B53/00 ,  G01B5/06 ,  G01B11/06 ,  G01R1/067 ,  G01R1/073 ,  H01H1/60 ,  H01L21/50 ,  H01L21/66 ,  G01R31/00

Abstract: 1281811 Electrical testing INTERNATIONAL BUSINESS MACHINES CORP 8 Jan 1970 [15 Jan 1969] 1045/70 Heading H2E [Also in Division H1] An electrical testing apparatus comprises a rotary head 10 supporting a plurality of vacuum tubes 11 for holding devices 12 to be tested. Each testing station has contact blades 18 having raised contacting portions 19 which are cleaned on each cycle of head 10 by an abrasive stone 20. The resulting debris is cleared by air supplied to a nozzle 32 from a vacuum distributer which also supplies the vacuum to the vacuum tubes 11. The stone 20 is supported on an arm 21 and a wheel 29 on the arm 21 is urged by a spring 30 on to the top of a wall 28. Where there is an obstruction on the fixed part of the apparatus the wall 28 rises, and the wheel 29 rides up the wall and lifts the stone 20 clear of the obstruction. As well as test stations (17, Fig. 1, not shown) the apparatus includes a feed bowl (14) for feeding the devices 12 to the tubes 11, an orientor station (15) and a sorter (16) for receiving the tested devices. The devices may be semi-conductor chips, transistors, diodes, or integrated circuits. As an alternative to the stone 20 the contacts may be cleaned by a brush or a cleaning chemical, and instead of the air jet the debris may be removed by a brush.

公开(公告)号：CA910049A

公开(公告)日：1972-09-19

申请号：CA910049D

Applicant: IBM

Inventor： GUNTHERT RICHARD J ,  ARONSTEIN JESSE

IPC: B24B19/00 ,  G01B5/06 ,  G01B11/06 ,  G01R1/067 ,  G01R1/073 ,  G01R31/00 ,  H01H9/00

公开(公告)号：AU6308273A

公开(公告)日：1975-06-05

申请号：AU6308273

申请日：1973-11-30

Applicant: IBM

Inventor： RUDER WINFRIELD SCOTT ,  LEOFF ARKADY ,  ZEISS PHILIP MORRIS ,  MURPHY JOHN JOSEPH ,  ARONSTEIN JESSE ,  HARDING WILLIAM EUGENE

IPC: H01L21/00 ,  H01L21/677 ,  H01L21/683 ,  H01L7/68

公开(公告)号：CA881932A

公开(公告)日：1971-09-28

申请号：CA881932D

Applicant: IBM

Inventor： ARONSTEIN JESSE ,  GUNTHERT RICHARD J ,  TROLLMANN CONRAD