Abstract:
Disclosed is a high voltage driver circuit for writing information into a read mostly memory array, the memory cells of the array being characterized by requiring much higher potential levels for writing information than for reading information.
Abstract:
Disclosed is a memory cell incorporating the major advantages of a read only storage (ROS) and having the flexibility of on-chip personalization after processing. In a memory matrix having orthogonally arranged bit lines and word lines with memory cells located at the cross points, each of the disclosed memory cells constructed in accordance with BIFET technology includes a floating gate avalanche breakdown MOS transistor (FAMOS) coupled to a bipolar transistor. The residual charge on the floating gate FAMOS transistor determines the logical state of the read mostly memory cell.
Abstract:
Disclosed is a memory cell incorporating the major advantages of a read only storage (ROS) and having the flexibility of on-chip personalization after processing. In a memory matrix having orthogonally arranged bit lines and word lines with memory cells located at the cross points, each of the disclosed memory cells constructed in accordance with BIFET technology includes a floating gate avalanche breakdown MOS transistor (FAMOS) coupled to a bipolar transistor. The residual charge on the floating gate FAMOS transistor determines the logical state of the read mostly memory cell.
Abstract:
A high-voltage integrated driver circuit for driving the word lines of a digital computer memory array of floating-gate avalanche-injection transistor memory cells, and for other applications where a high driving voltage is required. The disclosed driver circuit comprises a field-effect output transistor having a source electrode connected to a respective word line, a drain electrode adapted to have a chip select pulse signal applied thereto, and a gate electrode connected to selectably operable circuitry which may be conditioned either to a first state for clamping the voltage of the gate to cut off the output transistor and thereby maintain the output and the word line at a first voltage level, or to a second state for unclamping the voltage of the gate of the output transistor to permit the voltage of the output and the respective word line to swing with a high amplitude so as to cause the selected memory cell transistor to go into avalanche breakdown and thereby charge its floating gate so as to store a bit of information in the selected cell.
Abstract:
READ MOSTLY MEMORY CELL HAVING BIPOLAR AND FAMOS TRANSISTOR Disclosed is a memory cell incorporating the major advantages of a read only storage (ROS) and having the flexibility of on-chip personalization after processing. In a memory matrix having orthogonally arranged bit lines and word lines with memory cells located at the cross points, each of the disclosed memory cells constructed in accordance with BIFET technology includes a floating gate avalanche breakdown MOS transistor(FAMOS) coupled to a bipolar transistor. The residual charge on the floating gate FAMOS transistor determines the logical state of the read mostly memory cell.