公开(公告)号：DE1930275A1

公开(公告)日：1970-02-12

申请号：DE1930275

申请日：1969-06-13

Applicant: IBM

Inventor： HEINZ FREI ARMIN

IPC: H03M1/00 ,  H03K13/10

Abstract: This disclosure provides an analog to digital converter comprising n tunnel diode measuring circuits connected at regular intervals to a transmission line. One end of the line is tied to a gate circuit which samples analog voltages under control of a clock signal; the other end of the line is terminated in its characteristic impedance. The measuring circuits are connected in accordance with their ordinal numbers to n measuring transmission lines supplying calibrated measuring pulses derived by a pulse generator from the clock signal. In each measuring line, a short circuiting switch is inserted after the first connection of the line to a respective measuring circuit, each switch being connected for control to the digital output of the corresponding measuring circuit.

公开(公告)号：DE2133322A1

公开(公告)日：1972-01-20

申请号：DE2133322

申请日：1971-07-05

Applicant: IBM

Inventor： HEINZ FREI ARMIN ,  VETTIGER PETER

IPC: H03F3/72 ,  H03G1/00 ,  H03K17/693 ,  H04J3/04 ,  H03K17/00

Abstract: A field-effect transistor is inserted in the series feedback path of a bipolar transistor at whose base terminal the analog input signal to be sampled is applied. The bipolar transistor is continuously maintained in its conductive state by drawing a current I0 from the emitter. The field-effect transistor is switched back and forth between its high and low impedance states by a sampling signal applied to its gate. The analog input signal is amplified, and therefore sampled, only when the field-effect transistor is in its low impedance state.