公开(公告)号：BE744429A

公开(公告)日：1970-07-14

申请号：BE744429D

申请日：1970-01-14

Applicant: IBM

Inventor： AMES I ,  HEURLE F M D ,  HORSTMANN R E

IPC: H01L23/52 ,  H01B1/00 ,  H01B1/02 ,  H01L21/00 ,  H01L21/28 ,  H01L21/3205 ,  H01L23/29 ,  H01L23/485 ,  H01L27/00 ,  H01L29/43 ,  H05K

Abstract: This disclosure provides a copper doped aluminum conductive thin film stripe for use as a current-carrying member in a solid state microelectronic configuration which has substantial resistance against circuit failure due to damage caused by current-induced mass transport in the stripe. It has also been discovered for the practice of this invention that the addition of a relatively small amount of copper to an aluminum stripe together with a suitable heat-treatment enhances the extent of its lifetime during current conduction. Preferably, the percentage copper is from the neighborhood of 0.1 percent to the neighborhood of 10 percent by weight composition of copper in the aluminum and with an annealing heat-treatment in the approximate range of 250 DEG C to 560 DEG C. However, for certain operational conditions of the stripe a selected percent less than 54 percent copper by weight composition is advantageous.

公开(公告)号：BE761083A

公开(公告)日：1971-05-27

申请号：BE761083

申请日：1970-12-30

Applicant: IBM

Inventor： CHAUDHARI P ,  HEURLE F M D ,  GANGULEE A

IPC: H01C17/06 ,  C23C14/14 ,  H01B1/00 ,  H01F10/06 ,  H01F10/10 ,  H01L21/00 ,  H01L21/28 ,  H01L21/3205 ,  H01L23/52 ,  H01L23/532 ,  H01L29/43 ,  H01L39/22 ,  H01L39/24 ,  H05K3/14 ,  H01L