Method and system to improve read reliability in memory devices

    公开(公告)号:GB2605543A

    公开(公告)日:2022-10-05

    申请号:GB202209150

    申请日:2020-10-21

    Applicant: IBM

    Abstract: A system and method for storing data that includes at least one memory device having a plurality of memory cells for storing data; and a memory control circuit that manages the read current and read pulse width applied to the memory cells, wherein the at least one memory device has a read current circuit configured to utilize adjustments to at least one of the read current or the read pulse width applied to the memory cells. In response to a request to read a group of the memory cells, the memory control circuit in an example, in response to determining that a comparative temperature value exceeds a first threshold, is configured to perform at least one of reducing the read current and/or increasing the read pulse width to be applied to the group of memory devices to be read.

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