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公开(公告)号:CA993999A
公开(公告)日:1976-07-27
申请号:CA167868
申请日:1973-03-28
Applicant: IBM
Inventor: CARTER WILLIAM C , HSIEH EDWARD P , WADIA ASPI B
Abstract: Novel error correction and detection codes and self-checking translators therefor are disclosed. A first of these codes is a t b-adjacent bit group error correcting and t+d b-adjacent d-adjacent bit group error detecting code using a quantity of 2t+d groups of b check bits. This code with a b-bit BSM (basic storage module) memory organization is capable of correcting b-adjacent errors due to failures in any t basic storage modules, detecting b-adjacent errors due to failures in any t+d basic storage modules, and, because of the translator design, detecting with high probability b-adjacent errors in 2t+2d-1 storage modules where 1