公开(公告)号：DE1923918A1

公开(公告)日：1969-11-27

申请号：DE1923918

申请日：1969-05-10

Applicant: IBM

Inventor： ARONSTEIN JESSE ,  JOHN GUNTHERT RICHARD ,  TROLLMANN CONRAD

IPC: B07C5/06

Abstract: 1,247,412. Conveyers; shoots. INTERNATIONAL BUSINESS MACHINES CORP. 15 May, 1969 [16 May, 1968], No. 24813/69. Headings B8A and B8S. [Also in Division G1] A trough 1, 3, Fig. 2, feeds objects such as metal pins, needle bearings or wood dowels 2 into grooves 4 on a rotating disc 7 or conveyer belt where they are held in position by abutting a reference surface 5 and by suction applied to the bottoms of the grooves, Fig. 3 (not shown). Arms 20, 21, Fig. 1, assist pins into individual grooves and return excess pins by duct 36 to the trough, and a spring finger or pusher 22, Fig. 4 (not shown), moves the pins against the surface 5. As the disc rotates, the longest pins are knocked by a block 41 into a gravity collecting bin, and the next longest pins are removed by blocks 42-46 in turn, see, also Figs. 7a, 7b (not shown). A final release block 70 is provided, or this block may be replaced by an air jet forced through the vacuum orifices in the grooves. In Figs. 8 and 9 two nearly interengaging discs are provided and the pins are dropped between them and pushed into the grooves by means of a vee bar (84). Both the vee bar and a pin feeding trough (86) and also a funnel may be agitated by a vibrator (88). In a modification the grooves are on the interior surface of a ring and the pins are held therein by centrifugal force. The pins may be projected into the grooves by air pressure and collected by vacuum means or by magnets, and the pin release means may also use air jets or require the de-energization of induced magnetic fields or employ light reflecting from the pins into photoelectric cells.

公开(公告)号：DE2001534A1

公开(公告)日：1970-11-19

申请号：DE2001534

申请日：1970-01-14

Applicant: IBM

Inventor： ARONSTEIN JESSE ,  JOHN GUNTHERT RICHARD

IPC: B24B53/00 ,  G01B5/06 ,  G01B11/06 ,  G01R1/067 ,  G01R1/073 ,  H01H1/60 ,  H01L21/50 ,  H01L21/66 ,  G01R31/00

Abstract: 1281811 Electrical testing INTERNATIONAL BUSINESS MACHINES CORP 8 Jan 1970 [15 Jan 1969] 1045/70 Heading H2E [Also in Division H1] An electrical testing apparatus comprises a rotary head 10 supporting a plurality of vacuum tubes 11 for holding devices 12 to be tested. Each testing station has contact blades 18 having raised contacting portions 19 which are cleaned on each cycle of head 10 by an abrasive stone 20. The resulting debris is cleared by air supplied to a nozzle 32 from a vacuum distributer which also supplies the vacuum to the vacuum tubes 11. The stone 20 is supported on an arm 21 and a wheel 29 on the arm 21 is urged by a spring 30 on to the top of a wall 28. Where there is an obstruction on the fixed part of the apparatus the wall 28 rises, and the wheel 29 rides up the wall and lifts the stone 20 clear of the obstruction. As well as test stations (17, Fig. 1, not shown) the apparatus includes a feed bowl (14) for feeding the devices 12 to the tubes 11, an orientor station (15) and a sorter (16) for receiving the tested devices. The devices may be semi-conductor chips, transistors, diodes, or integrated circuits. As an alternative to the stone 20 the contacts may be cleaned by a brush or a cleaning chemical, and instead of the air jet the debris may be removed by a brush.

公开(公告)号：DE1939676A1

公开(公告)日：1970-08-13

申请号：DE1939676

申请日：1969-08-05

Applicant: IBM

Inventor： JOHN GUNTHERT RICHARD

IPC: G01R1/067 ,  G01R1/073 ,  H01H1/32 ,  H01R11/00

Abstract: 1275948 Probes INTERNATIONAL BUSINESS MACHINES CORP 28 Aug 1969 [28 Aug 1968] 42876/69 Heading H2E A probe 305 for making simultaneous current and potential connections to a ball-shaped electrical terminal 307 has a pair of contacts 301, 302 separated by an insulating layer 303 which is cut short at the probe tip to expose inwardly-facing, bevelled contact surfaces 311, 312. The surfaces form a trough which makes contact at two points on the ball 307 of solder on the surface of a semi-conductor device 308 which is held rigidly on a support 309. A formula is given for the maximum angle of the trough to ensure self-alignment of the probe. The surfaces 311, 312 may alternatively be curved, e.g. parabolic. A probe may be held in a device (401-403, Fig. 2, not shown) which permits freedom of movement of the probe in two directions parallel to a support 309.