MAGNETIC DOMAIN DEVICE MODULAR ASSEMBLY

    公开(公告)号:DE2960622D1

    公开(公告)日:1981-11-12

    申请号:DE2960622

    申请日:1979-05-22

    Applicant: IBM

    Abstract: Groups (11-13) of one or more magnetic domain chips (5) are mounted in an array on the circuitized surface (2) of a common substrate (1). A rectangular pattern of slots (14) is provided in the substrate (1) around each group (11-13). Each group is encompassed through the slots (14) by the turns of the inner and outer orthogonal solenoids (15-20) of its own exclusive rotational magnetic field drive system and by a permanent magnet bias field closed structure (22-32). Each chip (5) has a pattern of I/O pads (6) located on its under-surface (8). These pads (6) are bonded to a corresponding pattern of terminal pads (7) which are part of the circuitized surface (2) of the substrate (1). The interconnecting signal lines (9) to the terminal pads (7) of the substrate (1) pass through one or more of the four intersection corners formed between the slots (14) of the rectangular pattern. Preferably, the substrate (1) also accommodates integrated circuit modules and/or other components (34-41) mounted thereon which are associated with the drive, sense, and other support circuitry for the magnetic domain chips (5).

    5.
    发明专利
    未知

    公开(公告)号:DE2748350A1

    公开(公告)日:1978-05-11

    申请号:DE2748350

    申请日:1977-10-28

    Applicant: IBM

    Abstract: Heat is removed from the silicon devices in an integrated circuit package by means of a stud which is slidably mounted in a cap enclosing the integrated circuit device. A low melt solder is used to join the stud to the cap and the same solder is also deposited on the stud tip, which will subsequently contact the integrated circuit device in the package. After the integrated circuit, substrate and cap are assembled and sealed, the assembly is heated to melt the low melt solder so that the stud slides down and makes contact with the integrated circuit device. A controlled pressure can be applied to the stud if sliding does not occur. Thereafter, the assembly is allowed to cool. Upon cooling, a submicron gap exists between the solder on the tip of the stud and the device providing electrical isolation, but not significantly degrading the thermal path between the device and the ambient atmosphere.

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