公开(公告)号：CA1197290A

公开(公告)日：1985-11-26

申请号：CA433745

申请日：1983-08-03

Applicant: IBM

Inventor： GHEEWALA TUSHAR R ,  KAPLAN STEVEN B

IPC: H03K7/02 ,  G01R13/34 ,  H01L39/22 ,  H03K17/92 ,  H03K19/195

Abstract: SOLITON SAMPLER The invention is an all-soliton sampler for accessing very high speed circuits. A soliton is switched in two parallel branches, one including the device under test and the other including a programmable delay line implemented in soliton devices. The outputs of these two branches are used as controls to a soliton comparator which, in turn, controls a Josephson detector gate. This circuit permits a relatively slow rise time external trigger pulse to initiate an extremely narrow sampling pulse. An object of the invention is to reduce the width of the sampling pulse (which is of order 5ps, set by the inductance and capacitance of the pulse generator) in order to decrease jitter, to obtain the fastest trigger pulse possible without generating appreciable crosstalk. In the soliton sampler according to this invention, extremely narrow test-gate trigger signals and sampling pulses (of width A? 1 ps) are generated simultaneously by an external trigger with a relatively long rise time. The addition of an on-chip programmable delay circuit allows highresolution sampling to be done without appreciable jitter. Problems with crosstalk are alleviated by allowing a long rise time on the external trigger.