公开(公告)号：JPS6291873A

公开(公告)日：1987-04-27

申请号：JP18026286

申请日：1986-08-01

Applicant: IBM

Inventor： DAVIDSON EVAN E ,  KIESLING DAVID A

IPC: H01L21/66 ,  G01R31/28 ,  G01R31/316 ,  G01R31/319 ,  H01L21/822 ,  H01L27/04

公开(公告)号：DE3686989T2

公开(公告)日：1993-04-22

申请号：DE3686989

申请日：1986-08-08

Applicant: IBM

Inventor： DAVIDSON EVAN E ,  KIESLING DAVID A

IPC: H01L21/66 ,  G01R31/28 ,  G01R31/316 ,  G01R31/319 ,  H01L21/822 ,  H01L27/04 ,  G06F11/26

Abstract: A test system having improved means for reducing driver switching (delta I) noise. The test system employs a tester connected to and electrically testing an integrated circuit device, such as a logic chip. The integrated circuit device has a plurality of input terminals (R5-R54) for receiving an electrical test pattern from the tester. The integrated circuit device also includes a plurality of output driver circuits (D2-D1O2) having outputs connected to the tester. The test system is characterized in that said integrated circuit device includes a driver sequencing circuit (L1-L1O) responsive to at least one control signal (R1-R4) from said tester to sequentially condition said driver circuits for possible switching, whereby delta I noise is reduced during testing.

公开(公告)号：DE3686989D1

公开(公告)日：1992-11-26

申请号：DE3686989

申请日：1986-08-08

Applicant: IBM

Inventor： DAVIDSON EVAN E ,  KIESLING DAVID A

IPC: H01L21/66 ,  G01R31/28 ,  G01R31/316 ,  G01R31/319 ,  H01L21/822 ,  H01L27/04 ,  G06F11/26

Abstract: A test system having improved means for reducing driver switching (delta I) noise. The test system employs a tester connected to and electrically testing an integrated circuit device, such as a logic chip. The integrated circuit device has a plurality of input terminals (R5-R54) for receiving an electrical test pattern from the tester. The integrated circuit device also includes a plurality of output driver circuits (D2-D1O2) having outputs connected to the tester. The test system is characterized in that said integrated circuit device includes a driver sequencing circuit (L1-L1O) responsive to at least one control signal (R1-R4) from said tester to sequentially condition said driver circuits for possible switching, whereby delta I noise is reduced during testing.