公开(公告)号：US3392830A

公开(公告)日：1968-07-16

申请号：US46839565

申请日：1965-06-29

Applicant: IBM

Inventor： BRODERICK JOHN W ,  DAWLEY ROBERT E ,  FIORENZA ROBERT M ,  KOZAR MICHAEL ,  LINEMAN HARRY L ,  PIERSON ROLAND L

IPC: B07C5/344 ,  G01R1/073 ,  G01R31/02 ,  G01R31/26 ,  G01R31/316 ,  G01R31/319 ,  G07C3/00 ,  H01L21/66

CPC classification number: G01R1/073 ,  B07C5/344 ,  G01R31/02 ,  G01R31/2601 ,  G01R31/2893 ,  G01R31/316 ,  G01R31/31917 ,  G07C3/005 ,  Y10S209/905

公开(公告)号：DE1516941A1

公开(公告)日：1969-06-26

申请号：DEJ0031121

申请日：1966-06-21

Applicant: IBM

Inventor： WILLIAM BRODERICK JOHN ,  ELVIN DAWLEY ROBERT ,  MANSFIELD FIORENZA ROBERT ,  KOZAR MICHAEL ,  LEE LINEMANN HARRY ,  LUTHER PIERSON ROLAND

IPC: B07C5/344 ,  G01R1/073 ,  G01R31/02 ,  G01R31/26 ,  G01R31/28 ,  G01R31/316 ,  G01R31/319 ,  G07C3/00 ,  H01L21/66

Abstract: 1,125,229. Feeding transistors. INTERNATIONAL BUSINESS MACHINES CORP. 24 June, 1966 [30 June, 1965 (4)], No. 28387/66. Heading B8A. [Also in Divisions G1 and G3] A handling mechanism used for enabling transistor chips to be transported between a number of test stations, a number of electrical tests being performed at each station (see Division G1), incorporates a vibrating bowl 25 1 in the base of which is cut a triple spiral of closely spaced grooves (Fig. 30, not shown). The transistors to be tested are placed in the bowl, and the vibration causes them to be caught with electrodes down in one of four orientations in the groove. They are vibrated along the spiral and are presented to a vacuum head 42 1 . At an indexing operation of the mechanism, vacuum is applied to this via a valve arrangement (Fig. 29, not shown) situated immediately below the central part of the support table 44 1 , to pick up the transistor chip. The table 44 1 is then lifted and rotated by one position by a motor driven cam arrangement (Fig. 27, not shown) operated from the control circuits of the overall test apparatus. The vacuum head is then brought down on to a test station 26 1 where the orientation of the transistor is sensed. Thereafter it is presented to a mechanism 28 1 which responds to the result of this sensing test to rotate the transistor into the correct orientation before testing at stations 30 1 -36 1 , after which it is sorted into one of eight categories at station 38 1 .

公开(公告)号：CA822304A

公开(公告)日：1969-09-02

申请号：CA822304D

Applicant: IBM

Inventor： FIORENZA ROBERT M ,  KOZAR MICHAEL ,  BRODERICK JOHN W ,  LINEMAN HARRY L