Method for maintaining digital content in content management system, computer program, and content management system
    1.
    发明专利
    Method for maintaining digital content in content management system, computer program, and content management system 有权
    内容管理系统维护数字内容的方法,计算机程序和内容管理系统

    公开(公告)号:JP2007220111A

    公开(公告)日:2007-08-30

    申请号:JP2007028257

    申请日:2007-02-07

    CPC classification number: G06F21/10

    Abstract: PROBLEM TO BE SOLVED: To cope with the necessity for a system and a method for ensuring, that a policy related to protected digital content to be imported to a content management system does not conflict with a policy which is applied to the digital content by the content management system. SOLUTION: The method comprises: a step for receiving the digital content; a step for determining whether the digital content has already been protected by a digital copyright management system; and a step for saving the digital content in the content management system, on condition that the digital content has not yet been protected. The method also comprises: a step for extracting first right information related to the digital content, on condition that the digital content has already been protected; and a step for comparing the first right information related to the digital content with the second right information related to the content management system. On condition that the first right information does not conflict with the second right information, the digital content is saved in the content management system. On condition that the first right information conflicts with the second right information, correction processing is performed. COPYRIGHT: (C)2007,JPO&INPIT

    Abstract translation: 要解决的问题:为了应对系统的必要性和确保与要导入到内容管理系统的受保护数字内容相关的策略与应用于数字的策略不冲突的方法 内容管理系统内容。 解决方案:该方法包括:接收数字内容的步骤; 确定数字内容是否已经被数字版权管理系统保护的步骤; 以及在数字内容尚未得到保护的条件下,在内容管理系统中保存数字内容的步骤。 该方法还包括:在数字内容已经被保护的条件下,提取与数字内容相关的第一正确信息的步骤; 以及将与数字内容相关的第一正确信息与与内容管理系统相关的第二正确信息进行比较的步骤。 在第一个正确的信息与第二个正确信息不冲突的情况下,数字内容被保存在内容管理系统中。 在第一正确信息与第二权利信息冲突的情况下,执行校正处理。 版权所有(C)2007,JPO&INPIT

    Apparatus and method for testing circuit traces on a flexible substrate

    公开(公告)号:GB2288084A

    公开(公告)日:1995-10-04

    申请号:GB9505893

    申请日:1995-03-23

    Applicant: IBM

    Abstract: A mechanism is provided for testing circuit traces extending along a flexible substrate (10) the flexible substrate (10) being fed in a longitudinal direction (15) between an upper plate (17) and a lower plate (18). The plates (17, 18) include a number of apertures (23) extending across the flexible substrate (10) with segments (20, 22) there between. The segments (22) of the lower plate (18) are arranged under the apertures (23) of the upper plate (17) and vice versa. Test probes (24) are applied to both sides of the flexible substrate (10) through the apertures (23) with the segments (20, 22) providing a backing surface for probe contact. A two-probe method (Figs 2 - 5 not shown) may be used to determine the electrical characteristics e.g. open circuits of a circuit trace extending between test points or a signal-probe method (Figs 6 - 7) may be used to determine the capacitance between a circuit trace and the plates (17, 18) thereby indicating short circuits. The substrate may be moved in incremental steps, as required to complete the testing process.

    Apparatus and method for testing circuit traces on a flexible substrate

    公开(公告)号:GB2288084B

    公开(公告)日:1997-10-15

    申请号:GB9505893

    申请日:1995-03-23

    Applicant: IBM

    Abstract: A mechanism is provided for testing circuit traces extending along a flexible substrate, which is fed in a longitudinal direction between an upper plate and a lower plate. The upper plate includes a number of upper apertures extending across the flexible substrate and a number of upper segments, also extending across the flexible substrate, between adjacent apertures. The lower plate includes lower segments extending under the upper apertures and lower apertures extending under the upper segments. Two upper test probes are moved above the flexible substrate, while two lower test probes are moved under the flexible substrate. Tests are applied to both sides of the flexible substrate as the probes are brought into contact with test points in the areas accessible through the upper and lower apertures, with segments extending along the apertures on the opposite sides of the flexible substrate providing a backing surface for probe contact. A two-probe method may be used to determine the electrical characteristics of a circuit trace extending between test points, or a single-probe method may be used to determine the capacitance between a circuit trace and the plates. Circuit areas on the substrate are moved between the plates in a series of incremental motions to expose various points through the apertures as required to complete the testing process.

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