1.
    发明专利
    未知

    公开(公告)号:DE2608642A1

    公开(公告)日:1976-09-16

    申请号:DE2608642

    申请日:1976-03-03

    Applicant: IBM

    Abstract: The invention relates to apparatus for the testing of high circuit density devices fabricated by large scale integration techniques. More specifically, the invention is directed to a test fixture used in a test system for determining the merit or electrical integrity of small semiconductor chips, diced from a semiconductor wafer having a large number of chips. Each chip being a high circuit density device, e.g., a small monolithic semiconductor structure having a large number of closely spaced circuits thereon and therein.

    POSITIONING DEVICE FOR AN OBJECT
    2.
    发明专利

    公开(公告)号:DE3265148D1

    公开(公告)日:1985-09-12

    申请号:DE3265148

    申请日:1982-03-09

    Applicant: IBM

    Abstract: An apparatus and method are disclosed for precisely positioning an object such as a circuit module (12, 108) by moving it a fixed distance from an unknown initial position, for the purpose, for example, of moving connector pins a fixed distance into associated socket connector springs (136). A resilient spring (40, 42, 100) is compressed between a fixed stop (18, 20, 90) and a member (48, 106) which engages the object; so that the object is moved an unknown distance (A, B, C) to an initial position determined by its encountering resistance which exceeds the force applied by the spring, such as the resistance provided by connector springs when connector pins are inserted. The compression existing in the bias spring is maintained when the initial position is reached while concurrently the engaging member (48, 106) is moved a fixed distance from the initial position, such as the desired insertion distance of connector pins into connector springs. A wedge (64, 124) and lever (72-84, 124-134) linkage maintains the spring compression while moving the engaging member.

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