PROCESS FOR MAKING AN IMPROVED DYNAMIC MEMORY CELL STRUCTURE

    公开(公告)号:DE3572890D1

    公开(公告)日:1989-10-12

    申请号:DE3572890

    申请日:1985-06-11

    Applicant: IBM

    Abstract: A process is provided for making an improved dynamic random access memory cell structure, the process includes the steps of depositing a conductive layer (24, 26) on a surface of a semiconductor substrate (10) having a given type conductivity, depositing a layer of polysilicon (28) over the conductive layer, depositing a layer of photoresist (30) over the polysilicon layer, defining openings (32, 34) in the photoresist layer and implanting ions of a conductivity type opposite to that of the given type conductivity through the openings and the polysilicon layer into the semiconductor substrate to form therein a conductive pocket or region having the opposite type conductivity resulting in a highly conductive and self-aligned storage node plate and bitisense line, respectively, of said dynamic memory cell structure.

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