Abstract:
A test system is connected to power supply means in a data processing system to detect and locate faults which occur due to power supply loading conditions. The data processing system has several functional units, each of which is powered by separate power supply means. The test system which is connected to and monitors the output of each of the power supply means includes filtering means for separating high frequency components from low frequency components, positive and negative polarity level detection means for the high frequency components and for the low frequency components and direct current positive and negative threshold detectors. When the system is in the power test mode, the outputs from the level and threshold detectors are gated to voltage status registers which are periodically interrogated by the data processing system to determine if a fault has occurred due to power supply loading conditions.
Abstract:
A multi-microprocessor implemented data processing system having a single cycle data transfer capability for its memory mapped peripheral devices is described. A host or controlling microprocessor provides address and control signals for memory accesses. In addition, it also determines that a peripheral operation is desired. When this occurs, a command is sent to the selected peripheral and a memory cycle, fetch or store, for the data transfer is initiated. The address bus is provided with the memory address for the needed data and a special decode that indicates the unique nature of this memory access. Logic circuit means are provided to detect the special decode and to intercept the data bus at the appropriate point in the bus cycle in response thereto. The logic circuit means is adapted to then responsively apply the correct control signals to the peripheral to enable the desired data transfer after the data bus has been intercepted.