Patent search ap:("IBM") AND inv:"ROUSH WALDEN BENNET" Page 1

1.

发明专利
METHOD FOR INSPECTING INTEGRATED CIRCUIT CHIPS 未知

公开(公告)号：DE3275683D1

公开(公告)日：1987-04-16

申请号：DE3275683

申请日：1982-04-15

Applicant: IBM

Inventor： FOUTS DAVID PERRY , JASPAL JASVIR SINGH , ROUSH WALDEN BENNET , SULLIVAN MICHAEL JAMES

IPC: G01B11/24 , G01B11/30 , H01L21/66

Patent Agency Ranking